A repository & source of cutting edge news about emerging terahertz technology, it's commercialization & innovations in THz devices, quality & process control, medical diagnostics, security, astronomy, communications, applications in graphene, metamaterials, CMOS, compressive sensing, 3d printing, and the Internet of Nanothings. NOTHING POSTED IS INVESTMENT ADVICE! REPOSTED COPYRIGHT IS FOR EDUCATIONAL USE.
Showing posts with label M. Kehrt. Show all posts
Showing posts with label M. Kehrt. Show all posts
Thursday, January 11, 2018
Abstract-Metrology of transmission and reflection measurements by TDS
A. Steiger, M. Kehrt, A. Deninger,
http://ieeexplore.ieee.org/document/8067221/
The aim of a common R&D project is the design and thorough characterization of a reference material for THz transmission and reflection measurements to leverage time-domain spectroscopy (TDS) for industrial applications.
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