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Thursday, January 11, 2018
Abstract-Metrology of transmission and reflection measurements by TDS
A. Steiger, M. Kehrt, A. Deninger,
http://ieeexplore.ieee.org/document/8067221/
The aim of a common R&D project is the design and thorough characterization of a reference material for THz transmission and reflection measurements to leverage time-domain spectroscopy (TDS) for industrial applications.
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