Prince Sharma, Mahesh Kumar, V.P.S. Awana, Anushree Singh, Himanshu Gohil, S.S. Prabhu,
We report the Terahertz time-domain spectroscopy (THz-TDS) dielectric response of the large single crystal of BiSe and BiTe which are grown in-house through a solid-state reaction route via the self-flux method technique. We fit the obtained experimental complex dielectric constant to the Lorentz oscillator model and obtain various resonating mode strengths in both materials. The strength of dielectric constants is an order of magnitude different while comparing the Terahertz response of both the crystals. However, the dielectric relaxation times are similar for stronger modes, depicting the similarity between the two crystals.