TeraSpike - LT-GaAs photoconductive field detector
Key features
- Smallest active THz probe-tip on the market with only 1 µm cantilever thickness based on a patented design (DE 10 2009 000 823.3)
- Spatial resolution up to 3 µm
- Frequency range 0-4 THz
- Adaptable to all laser-based THz-Systems with λ < 860 nm
- Mounting compatible with standard opto-mechanical components
- Typical optical excitation power with common fs-lasers 1-5 mW (1-5 µJ/cm²)
Applications
- Terahertz research: Metamaterials, plasmonics, graphene, waveguides, …
- High-resolution Terahertz near-field imaging
- Contact-free sheet resistance imaging of semiconductors
- MMIC device characterization
- Non-destructive chip inspection
- Time-domain reflectometry (TDR)
Measured near-field distribution of a gated graphene layer on SiO2-Si revealing conductivity inhomogeneity.
Measured near-field image of a pulse-excited THz metamaterial surface.
Measured sheet conductivity image of a laser-doped multicrystalline silicon wafer.
Measurement services
AMO is also offering this innovative technology for measurement services on customer samples. Our advanced optoelectronic system with scanning speeds as high as 33 mm/s is able to provide crucial high-resolution conductivity information which is quasi inaccessible to existing measurement technology under cost and expenditure of time considerations.
For detailed information please refer to our service brochure or contact us directly.
Exemplary measurement set-up
The THz-Tip is mainly dedicated to be used in femtosecond pump probe experiments. The figure illustrates a typical set-up where the THz radiation transmitted through the sample is measured by the THz-Tip which is gated by the femtosecond probe beam.
Other configurations to measure in reflection or synchronized to HF devices in near-field are possible as well.
Best results, for fast transient recording, are obtained using a fast sampling technique like AMO´s AixScantechnology utilising shakers, ASOPS or ECOPS as a faster alternative to lock-in amplifiers with superior noise reduction also for low frequency noise.
Technical Data
AMO currently offers four different versions of near-field probes: The three probes from the X-series are sensitive to transversal THz field components. The new Z-series is sensitive to longitudinal THz field components. Within the X-series the HR-type is designed to provide highest spatial resolution while the HS-type is optimized for high sensitivity. The HRS-type offers highest field sensitivity from 0.5 THz to 1.3 THz at considerably higher spatial resolution (20 µm) than the HS (100 µm). All microprobes are designed for pulsed excitation and are equipped with an overvoltage protection. Each probe is individually tested and comes with manual & certificate enclosed.
For further information please take a look at our brochure (PDF file, 2 MB).
TeraSpike TD-800- | X-HR | X-HRS | X-HS | Z-A-500G |
Max. spatial resolution | 3 µm | 20 µm | 100 µm | 8 µm |
Photoconductive gap size at tip | 1.5 µm | 2 µm | 3 µm | 5 µm |
Dark current @ 1V Bias | < 0.5 nA | < 0.5 nA | < 0.4 nA | < 0.4 nA |
Photocurrent | > 1 µA | > 0.6 µA | > 0.6 µA | > 0.5 µA |
Excitation wavelength | 700 nm ... 860 nm | |||
Excitation power | 1 mW ... 4 mW | |||
Connection type | SMP |
excitation power 4 mW at a laser repetition rate of 80 MHz and approx. 100 fs pulse duration.
Integration in existing measurement systems
Order Information
TeraSpike TD-800- | THz photoconductive probe-tip with SMP plug |
Options: TD-800- | X-HR, X-HS, X-HRS or Z-A-500G |
TeraSpike Phantom | Dummy probe-tip device |
TS Cable | SMP to SMA/BNC probe connection cable |
TeraSpike Starter Kit | Contains one TeraSpike TD-800-(X-HR, X-HS, X-HRS or Z-A-500G), TeraSpike Phantom, TS Cable, mounting post and post holder |
DLPCA-200 | Variable gain current amplifier |
Sub-System D-B1 | Axial positioning, focusing, alignment unit |
Sub-System D-B2 | Vertical board base unit including D-B1 |
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