Berardi Sensale-Rodriguez *†, Rusen Yan †‡, Subrina Rafique †, Mingda Zhu †, Wei Li ‡§, Xuelei Liang §,David Gundlach ‡, Vladimir Protasenko †, Michelle M. Kelly †, Debdeep Jena †, Lei Liu †, and Huili Grace Xing *†
† Department of Electrical Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States
‡ Semiconductor and Dimensional Metrology Division,National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
§ Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing, 100871, China
Nano Lett., Article ASAP
DOI: 10.1021/nl3016329
Publication Date (Web): August 3, 2012
Copyright © 2012 American Chemical Society
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