A repository & source of cutting edge news about emerging terahertz technology, it's commercialization & innovations in THz devices, quality & process control, medical diagnostics, security, astronomy, communications, applications in graphene, metamaterials, CMOS, compressive sensing, 3d printing, and the Internet of Nanothings. NOTHING POSTED IS INVESTMENT ADVICE! REPOSTED COPYRIGHT IS FOR EDUCATIONAL USE.
Showing posts with label Mingda Zhu. Show all posts
Showing posts with label Mingda Zhu. Show all posts
Tuesday, September 18, 2018
Abstract-Comparison of unit cell coupling for grating‐gate and high electron mobility transistor array THz resonant absorbers
Ajay Nahata, Ashish Chanana, Berardi Sensale-Rodriguez, Debdeep Jena, Hugo O. Condori Quispe, Huili Grace Xing, Jimy Encomendero, Mingda Zhu, Nicole Trometer,
https://aip.scitation.org/doi/abs/10.1063/1.5032102
We report experimental studies on the excitation of synchronized plasmon resonances in AlGaN/GaN High Electron Mobility Transistor (HEMT) arrays. In contrast to the commonly employed grating-gate configurations, the analyzed structure contains periodically patterned ohmic contacts to the two-dimensional electron gas, which are laid-out parallel to the gate fingers. In this structure, the terahertz to plasmon coupling mechanism is fundamentally different from that in grating-gate configurations. Whereas the grating-gate configuration constitutes a coupled resonant system in which the resonance frequency depends on the grating periodicity, when periodical ohmic contacts are incorporated, the system behaves as a synchronized resonant system in which each unit cell is effectively independent. As a result, in a HEMT-array, the resonance is no longer set by the periodicity but rather by the gate and the ungated region length. Experimental results of fabricated samples compare well with numerical simulations and theoretical expectations. Our work demonstrates that the proposed approach allows: (i) more efficient excitation of high order plasmon modes and (ii) superior overall terahertz to plasmon coupling, even in configurations having less number of devices per unit area. From this perspective, our results reveal a simple way to enhance the terahertz to plasmon coupling and thus improve the performance of electron plasma wave-based devices; this effect can be exploited, for example, to improve the response of HEMT-based terahertz detectors.
Monday, September 10, 2018
Abstract-Comparison of unit cell coupling for grating‐gate and high electron mobility transistor array THz resonant absorbers
Hugo O. Condori Quispe, Ashish Chanana, Jimy Encomendero,Mingda Zhu, Nicole Trometer, Ajay Nahata, Debdeep Jena, Huili Grace Xing,Berardi Sensale-Rodriguez,
https://aip.scitation.org/doi/10.1063/1.5032102
We report experimental studies on the excitation of synchronized plasmon resonances in AlGaN/GaN High Electron Mobility Transistor (HEMT) arrays. In contrast to the commonly employed grating-gate configurations, the analyzed structure contains periodically patterned ohmic contacts to the two-dimensional electron gas, which are laid-out parallel to the gate fingers. In this structure, the terahertz to plasmon coupling mechanism is fundamentally different from that in grating-gate configurations. Whereas the grating-gate configuration constitutes a coupled resonant system in which the resonance frequency depends on the grating periodicity, when periodical ohmic contacts are incorporated, the system behaves as a synchronized resonant system in which each unit cell is effectively independent. As a result, in a HEMT-array, the resonance is no longer set by the periodicity but rather by the gate and the ungated region length. Experimental results of fabricated samples compare well with numerical simulations and theoretical expectations. Our work demonstrates that the proposed approach allows: (i) more efficient excitation of high order plasmon modes and (ii) superior overall terahertz to plasmon coupling, even in configurations having less number of devices per unit area. From this perspective, our results reveal a simple way to enhance the terahertz to plasmon coupling and thus improve the performance of electron plasma wave-based devices; this effect can be exploited, for example, to improve the response of HEMT-based terahertz detectors.
Monday, January 28, 2013
Abstract-Terahertz imaging employing graphene modulator arrays
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In this paper we propose and experimentally demonstrate arrays of graphene electro-absorption modulators as electrically reconfigurable patterns for terahertz cameras. The active element of these modulators consists of only single-atom-thick graphene, achieving a modulation of the THz wave reflectance > 50% with a potential modulation depth approaching 100%. Although the prototype presented here only contains 4x4 pixels, it reveals the possibility of developing reliable low-cost video-rate THz imaging systems employing single detector.
Monday, November 26, 2012
Abstract-Efficient terahertz electro-absorption modulation employing graphene plasmonic structures
http://arxiv.org/abs/1211.4176
Berardi Sensale-Rodriguez, Rusen Yan, Mingda Zhu, Debdeep Jena, Lei Liu, Huili Grace Xing
We propose and discuss terahertz electro-absorption modulators based on graphene plasmonic structures. The active device consists of a self-gated pair of graphene layers, which are patterned to structures supporting THz plasmonic resonances. These structures allow for efficient control of the effective THz optical conductivity, thus absorption, even at frequencies much higher than the Drude roll-off in graphene where most previously proposed graphene-based devices become inefficient. Our analysis shows that reflectance-based device configurations, engineered so that the electric field is enhanced in the active graphene pair, could achieve very high modulation-depth, even ~100%, at any frequency up to tens of THz.
Tuesday, August 14, 2012
Abstract-Extraordinary Control of Terahertz Beam Reflectance in Graphene Electro-absorption Modulators
Berardi Sensale-Rodriguez *†, Rusen Yan †‡, Subrina Rafique †, Mingda Zhu †, Wei Li ‡§, Xuelei Liang §,David Gundlach ‡, Vladimir Protasenko †, Michelle M. Kelly †, Debdeep Jena †, Lei Liu †, and Huili Grace Xing *†
† Department of Electrical Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States
‡ Semiconductor and Dimensional Metrology Division,National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
§ Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing, 100871, China
Nano Lett., Article ASAP
DOI: 10.1021/nl3016329
Publication Date (Web): August 3, 2012
Copyright © 2012 American Chemical Society
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