Columbus, Ohio, September 15, 2011 – Traycer Inc’s Chief Technical Officer, Lee Mosbacker Ph.D., was one of the presenters invited to present at The Ohio State University Institute for Materials Research 4th annual Materials Week symposia, September 12-14, 2011. Dr. Mosbacker’s presentation, “New Developments in 80x64 Terahertz Focal Plane Array Imaging,” highlighted, for the first time publicly, some of the advances Traycer is making in Terahertz imaging.
“We are very excited with the images achieved to this point and look forward to even greater strides forward in this emerging field,” said Brad Beasecker, CEO of Traycer. “The Terahertz research community has been working to produce this type of image for many years, and we are pleased to be able to bring this evidence to light.”
“Recent developments in the Terahertz technology continue to demonstrate that it’s evolution and growth will mirror that of the infrared industry,” according to Elliott Brown, Ph.D., Professor of Physics and Electrical Engineering, Wright State University, Dayton, Ohio.
The annual Materials Research conference showcases materials-allied research at Ohio State and beyond. The event brings together hundreds of researchers from OSU, other universities, industry and government labs at technical talks, poster sessions and evening receptions covering the full spectrum of materials-allied research.
About Traycer, Inc.
Traycer, Inc., based in Columbus, Ohio, is a leader in developing terahertz components for researchers and application developers in the field of imaging, detection and generation of terahertz light. Traycer is dedicated to providing unique solutions to realize terahertz applications in nondestructive evaluation, quality control and security screening.
Traycer, Inc., based in Columbus, Ohio, is a leader in developing terahertz components for researchers and application developers in the field of imaging, detection and generation of terahertz light. Traycer is dedicated to providing unique solutions to realize terahertz applications in nondestructive evaluation, quality control and security screening.
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