Showing posts with label packaging. Show all posts
Showing posts with label packaging. Show all posts

Sunday, May 21, 2017

Abstract-Packages for Terahertz Electronics



Ho-Jin Song

http://ieeexplore.ieee.org/document/7819502/

In the last couple of decades, solid-state device technologies, particularly electronic semiconductor devices, have been greatly advanced and investigated for possible adoption in various terahertz (THz) applications, such as imaging, security, and wireless communications. In tandem with these investigations, researchers have been exploring ways to package those THz electronic devices and integrated circuits for practical use. Packages are fundamentally expected to provide a physical housing for devices and integrated circuits (ICs) and reliable signal interconnections from the inside to the outside or vice versa. However, as frequency increases, we face several challenges associated with signal loss, dimensions, and fabrication. This paper provides a broad overview of recent progress in interconnections and packaging technologies dealing with these issues for THz electronics. In particular, emerging concepts based on commercial ceramic technologies, micromachining, and 3-D printing technologies for compact and lightweight packaging in practical applications are highlighted, along with metallic split blocks with rectangular waveguides, which are still considered the most valid and reliable approach.

Sunday, May 3, 2015

Semicon 2016 Process Control packaging technology

Speaker Dr. Shang Yang, PhD
Company Advantest (SINGAPORE) Pte Ltd
Designation Senior R&D and Application Engineer

The chip technology is guided by Moore’s law for the past few decades. As the 2-dimension scaling of transistors is gradually approaching its physical limitation, several new directions, such as 3-dimension IC (3D IC) and Opto-Electronic IC (OEIC), are proposed to follow and even transcend Moore’s law. As a result, several challenges are posed in the packaging technology, such as thermal management, reliability, and quality control,which ultimately impacts device performance.  

In recent years, Terahertz (THz) time-domain spectroscopy (TDS) imaging method has received considerable attention as a promising non-destructive technique for a 3D tomography scanning. Compared to the other non-destructive imaging techniques such as X-ray, Microwave or SAT (scanning acoustic tomographic), THz-TDS imaging method has many advantages in terms of scanning speed, image resolution, system robustness as well as operation safeness. In this presentation, various applications of THz-TDS have been discussed in the latest IC packaging technologies; followed by the introduction of ADVANTEST TS9000 Chip Mold Thickness Analysis System which help redefines the limits of traditional IC package analysis.

SEMICON Southeast Asia 2015