Abstract-Imaging on the Nanoscale with Terahertz Time-Domain and Emission Microscopy

Pernille Klarskov Pedersen, Angela Pizzuto, and Daniel M. Mittleman

https://www.osapublishing.org/abstract.cfm?uri=ISUPTW-2018-ThB3

We combine Laser Terahertz Emission Microscopy (LTEM) with terahertz time-domain nanoscopy in a near-field microscopy configuration. With this, we demonstrate how the two techniques provide complementary information about the sample.

© 2018 OSA

Abstract-Comparison between laser terahertz emission microscope and conventional methods for analysis of polycrystalline silicon solar cell

Hidetoshi Nakanishi^1,a), Akira Ito^1,b), Kazuhisa Takayama^2,c), Iwao Kawayama^2,d), Hironaru Murakami^2,e) and Masayoshi Tonouchi^2,f)
http://scitation.aip.org/content/aip/journal/adva/5/11/10.1063/1.4935913?TRACK=RSS
a) nakanisi@screen.co.jp, Tel:+81-75-931-7925(ext.8303427). 322 Furukawa-cho, Hazukashi, Fushimi-ku, Kyoto 612-8486, Japan
b) a.ito@screen.co.jp, Tel:+81-75-931-7925(ext.8306049)
c) takayama.k0123@gmail.com, Tel:+81-6-6879-7983
d) kawayama@ile.osaka-u.ac.jp, Tel:+81-6-6879-7983. 2-6 Yamadaoka, Suita, Osaka 565-0871, Japan
e) hiro@ile.osaka-u.ac.jp, Tel:+81-6-6879-7982
f) tonouchi@ile.osaka-u.ac.jp, Tel:+81-6-6879-7981.
AIP Advances 5, 117129 (2015); http://dx.doi.org/10.1063/1.4935913

A laser terahertz emission microscope (LTEM) can be used for noncontact inspection to detect the waveforms of photoinduced terahertz emissions from material devices. In this study, we experimentally compared the performance of LTEM with conventional analysis methods, e.g.,electroluminescence (EL), photoluminescence (PL), and laser beam induced current (LBIC), as an inspection method for solar cells. The results showed that LTEM was more sensitive to the characteristics of the depletion layer of the polycrystalline solar cell compared with EL, PL,and LBIC and that it could be used as a complementary tool to the conventional analysis methods for a solar cell