Showing posts with label chemical testing. Show all posts
Showing posts with label chemical testing. Show all posts

Wednesday, January 1, 2014

Imaging chemical reactions with terahertz








A novel laser-terahertz emission microscope is used to visualize changes in chemical and electrical potential.
31 December 2013, SPIE Newsroom. DOI: 10.1117/2.1201312.005281
In the technique of terahertz (THz) time-domain spectroscopy, the amplitude and phase of short-pulsed incident THz (i.e., 1012Hz) radiation are sensitive to a sample's material properties. Imaging systems that use THz time-domain spectroscopy are attractive for novel nondestructive testing (NDT) applications.1 The spatial resolution of such systems, however, has so far been limited by the wavelength of the THz radiation, which is about 300μm at 1THz.
Purchase SPIE Field Guide to MicroscopyA laser-THz emission microscope (LTME) has been proposed and developed for NDT of semiconductor devices, such as large-scale integrated circuits and solar panels.2–4 The spatial resolution of the laser-THz emission technique is not limited by the THz radiation wavelength, but by the wavelength of the femtosecond (i.e., 10−15s) laser that is used to generate the THz radiation. This means that higher spatial resolutions can be achieved using an LTME than with a conventional THz imaging system.
We have developed a THz chemical microscope (TCM) that can be used to visualize chemical and/or electrical potential shifts caused by chemical reactions.5, 6 Our TCM has a sensing plate that is made of thin silicon dioxide (SiO2) and silicon (Si) films on a sapphire substrate, as shown in Figure 1(a). When a femtosecond laser pulse travels through the substrate and hits the thin Si film, a THz pulse is generated and radiates into free space.
As a chemical reaction progresses on the sensing plate, the chemical and/or electrical potential at the surface of the plate shifts. This causes a change in the magnitude of the local field and results in variation of the generated THz pulse's amplitude. The THz pulse contains information about the chemical reaction at precisely the point it is illuminated by the laser pulse. We are therefore able to create a map of the chemical reaction by scanning the laser across the surface of the sensing plate. The spatial resolution of our TCM is currently about 50μm, but this can be improved by optimizing the aperture of the objective lens. A photograph of our prototype TCM is shown in Figure 1(b).
 
Figure 1. (a) Schematic diagram of the terahertz (THz) chemical microscope (TCM) sensing plate. A femtosecond laser is focused on the thin silicon (Si) film from the substrate side of the plate, and a THz pulse radiates into the free space. (b) Photograph of the prototype TCM system. SiO2: Silicon dioxide.
An image of an immune reaction that we obtained with our TCM is shown in Figure 2. During this reaction, mouse immunoglobulin G (IgG), at a concentration of about 275nmol/L, was initially immobilized by being covalently bound to the sensing plate. Anti-mouse-IgG (also with a concentration of 275nmol/L) was then reacted with the IgG on the sensing plate. We obtained a TCM image by measuring the shift in the THz pulse amplitude before and after the reaction. The image in Figure 2 shows that the THz pulse was enhanced at locations where IgG–anti-IgG bindings formed. Unlike conventional immunoassays (biochemical tests), the sensitivity of our TCM is independent of the sample material's molecular weight. We were able to detect small molecules (e.g., biotin) that are generally difficult to measure using conventional methods. Our results indicate that the TCM system can be used to perform label-free immunoassays.7
 
Figure 2. TCM image of the reaction between mouse immunoglobulin G (IgG) and anti-mouse-IgG.
Our TCM can also be used to detect ions (e.g., potassium, K+, and sodium, Na+) in water solutions: see Figure 3(a). A difference in electrical potential arises between membrane surfaces when the sensing membrane (on the sensing plate) comes into contact with the water solution containing the specific ions. This causes a change in the amplitude of the THz pulse. Figure 3(b) shows the TCM image we obtained when the concentration of sodium ions in a water solution was changed from 10−4mol/L to 10−1mol/L. The amplitude of the THz pulse increased at the points where the sensing membranes for Na+ ions were immobilized.
 
Figure 3. (a) Photograph of the TCM sensing plate, with immobilized sensing polymer membranes for sodium (Na+) and potassium (K+) ions. (b) TCM image obtained when the concentration of Na ions in the water solution on the sensing plate was changed from 10−4mol/L to 10−1mol/L.
We have designed and developed a TCM instrument that can detect several types of chemical reactions. Many different materials can be detected with a single scan of a femtosecond laser on a 10mm2 sensing chip. We are currently working to integrate biomaterials on a single chip. The TCM technique will be a useful screening tool, with applications in medical diagnosis and materials research. We are also developing fuel cells that will be mounted on the sensing chip so that catalytic reactions of their electrodes can be measured.
This work was partly supported by an Industry-Academia Collaborative R&D grant from the Japan Science and Technology Agency.

Toshihiko Kiwa, Kenji Sakai, Keiji Tsukada
Okayama University
Okayama, Japan
Toshihiko Kiwa is an associate professor. He received his PhD from Osaka University in 2003. He subsequently worked as a JSPS fellow at Osaka University's Research Center for Superconductor Photonics. His research interests include THz-sensing systems.
Kenji Sakai is an assistant professor and is involved in the research of magnetic sensors and superconducting quantum interference devices (SQUIDs) and their applications, nondestructive evaluation systems, and gas sensors. He was a research fellow of the Japan Society for the Promotion of Science between 2009 and 2010.
Keiji Tsukada is a professor whose research deals with hydrogen gas, ion, and magnetic sensors, as well as SQUIDs and their applications. From 1982 to 2003 he worked at the central research laboratory of Hitachi Ltd., where he was a project leader of the SQUID application research group.

References:
1. M. Tonouchi, Cutting-edge terahertz technology, Nat. Photon. 1, p. 97-105, 2007.
2. T. Kiwa, M. Tonouchi, M. Yamashita, K. Kawase, Laser terahertz-emission microscope for inspecting electrical faults in integrated circuits, Opt. Lett. 28, p. 2058-2060, 2003.
3. M. Yamashita, K. Kawase, C. Otani, T. Kiwa, M. Tonouchi, Imaging of large-scale integrated circuits using laser terahertz emission microscopy, Opt. Express 13, p. 115-120, 2005.
4. H. Nakanishi, K. A. Salek, S. Fujiwara, K. Takayama, I. Kawayama, H. Murakami, M. Tonouchi, Development of solar cell inspection system based on a laser terahertz emission microscope, 3rd EOS Topical Mtg. Terahertz Sci. Technol., p. 5291, 2012.
5. T. Kiwa, Y. Kondo, Y. Minami, I. Kawayama, M. Tonouchi, K. Tsukada, Terahertz chemical microscope for label-free detection of protein complex, Appl. Phys. Lett. 96, p. 211114, 2010.
6. T. Kiwa, T. Hagiwara, M. Shinomiya, K. Sakai, K. Tsukada, Work function shifts of catalytic metals under hydrogen gas visualized by terahertz chemical microscopy, Opt. Express 20, p. 11637-11642, 2012.
7. T. Kiwa, A. Tenma, S. Takahashi, K. Sakai, K. Tsukada, Label free immune assay using terahertz chemical microscope, Sens. Actuators B: Chem. 187, p. 8-11, 2013.

Monday, February 4, 2013

Advantest Expands Application Coverage of TAS7500 Series of Spectroscopic Imaging Systems with 2 New Systems; Transmittance Polarization Analysis Module Also Developed



Richer Spectroscopic Analysis Capability Increases
Applicability to Chemicals, Communications Material, Terahertz Research
SPIE Photonics West 2013
TOKYO--()--Advantest Corporation (TSE: 6857, NYSE: ATE), a global leader in test and measurement sciences, has developed two new spectroscopy systems and a new transmittance polarization analysis module for its TAS7500 product series of systems, which employ terahertz waves to perform non-destructive imaging and analysis of samples.
・Wide-Band Coverage: TAS7500SU Terahertz Spectroscopic System
・Low-Frequency Coverage: TAS7500SL Terahertz Spectroscopic System
・Transmittance Polarization Analysis Module for Terahertz Spectroscopic Analysis
The new systems and module dramatically expand the range of applications of the TAS7500 series to include chemicals and materials for high-speed communications components, in addition to the pharmaceutical applications covered by existing systems, while also delivering the ability to analyze the polarization characteristics of samples. The new products are scheduled for launch in March, 2013.
Advantest Enables New Applications for Terahertz Technology
In recent years the terahertz frequency range has increasingly been utilized in non-destructive measurement and spectroscopic analysis applications. Advantest has led the development of this technology, launching its 3D Imaging Analysis System, the TAS7000, in April 2010, followed in September 2011 by the groundbreaking TAS7500, a non-invasive, non-destructive analysis system for pharmaceutical applications. The company has continued to invest in expanding the analysis capabilities and applications coverage of its terahertz technology, leading to the development of the new TAS75000SU and TAS7500SL systems.
In combination with the previously launched TAS7500SP, these three systems, each covering a different bandwidth, greatly expand the TAS7500 series’ analysis range, and provide enhanced measurement quality in each frequency region. Further, Advantest’s newly developed transmittance polarization analysis module for spectroscopic analysis enables polarization characteristics analysis of optically anisotropic materials,* among others.
The new systems and module expand the applications of the TAS7500 series beyond the pharmaceutical arena, to fields including terahertz wireless communications, biotechnology, and research applications utilizing terahertz waves.
* Optically anisotropic materials display varying refraction indices depending on the polarization direction of the light directed at them.
Wide-Band Analysis System TAS7500SU
■ Improved High-Frequency Coverage Enables Diverse Terahertz Research Applications
Advantest’s Cherenkov THz radiation source* enables higher-frequency terahertz wave generation, giving the TAS7500SU an analysis range of 0.5 – 7.0 THz, compared to the 0.1 - 4THz range of the previous TAS7500SP system. This wider coverage facilitates diverse new analysis applications.
■ Industry-Best High-Speed Measurement Functionality
The TAS7500 series boasts an industry-best scan time of 8 milliseconds, ensuring speedy measurement results unaffected by exterior changes in humidity and temperature.
* Advantest’s new Cherenkov THz radiation source, which generates a superior range of frequencies, was announced in September 2012, as was the company’s terahertz time-of-flight (TOF) tomography analysis system, which employs the Cherenkov radiation source.
Low-Frequency Analysis System TAS7500SL
■30GHz-2THz Analysis Range Optimal for Terahertz Wireless Communications Materials Development, Other Applications
In the field of terahertz wireless communications—a technology expected to find practical applications in the near future—it is crucial for engineers to accurately analyze the characteristics of the materials they work with, such as permittivity and absorptiveness. The TAS7500SL is specialized for the 30GHz – 2THz band of the spectrum, optimizing it for R&D in the area of materials to be used for packages, boards, and other communications components, as well as spectroscopic analysis at these bandwidths.
Transmittance Polarization Analysis Module
■ Measurement of Crystalline & Molecular Structures Provides More Detailed Analysis Results
Advantest’s new transmittance polarization analysis module, which can be mounted on the TAS7500SP, enables polarization analysis of anisotropic optical materials, among others, via polarization characteristics measurement, thus providing more detailed analysis results.
■ Easy Operation Boosts Efficiency
In common with Advantest’s existing spectroscopic measurement modules (transmission, reflection, and ATR), the new transmittance polarization analysis module is easy to install and remove, aiding ease of operation in any measurement environment.
For more information:
TAS Project
info_t@jp.advantest.com
TEL:+81-22-392-8730
Advantest will exhibit at SPIE Photonics West at the Moscone Center, San Francisco on February 5-7, 2013.
About Advantest Corporation
A world-class technology company, Advantest is the leading producer of automatic test equipment (ATE) for the semiconductor industry and a premier manufacturer of measuring instruments used in the design and production of electronic instruments and systems. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has recently introduced multi-vision metrology scanning electron microscopes essential to photomask manufacturing, as well as a groundbreaking 3D imaging and analysis tool. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More information is available at www.advantest.com.

Contacts

Advantest Corporation
Hiroki Yanagita, PR/IR Section
Tel: +81-3-3214-7500

Tuesday, May 5, 2009

Abstracts Nuclear Gauges, Nondestructive Evaluation, Materials Analysis, Chemical Analysis of Art (thanks to bucktailjig!)

There is always reason to be excited about the developments in Terahertz technology. The following are just a small portion of the many, abstracts relating to on-going studies and projects which are certain to lead to commercial products, sooner or later. ( I want to believe in sooner ).

Time-Domain Terahertz Process Control Measurements to Replace Nuclear Source Gauges
Basic Information
Abstract Number:
1910-2


Author Name:
Jeffrey S White
Affiliation:
Picometrix LLC
Session Title:
Product Status / Process Stream Measurements
Event Type:
Oral
Event Title:
Time-Domain Terahertz Process Control Measurements to Replace Nuclear Source Gauges
Presider(s):
Woodman, Michael
Start Time:
08:50 AM ( Slot # 2 )
Date:
03/11/2009
Location:
S505a
Keywords:
Instrumentation, Paint/Coatings, Paper/Pulp, Process ControlCo-Authors
Name
Affiliation
Chernovsky, Artur
Picometrix LLC
Fichter, Greg
Picometrix LLC
Zimdars, David
Picometrix LLCAbstract Content
This presentation will detail Time-Domain Terahertz (TD-THz) instrumentation to address a number of measurement applications typically made with nuclear source gauges (alpha, beta, gamma). The goal of this Department of Homeland Security funded grant is to develop a functional economic technology to replace nuclear source gauges, thus removing the need to have such “orphaned” nuclear material in the commercial sector.Measurements will be demonstrated for basis weight (grams per square meter), thickness and density monitoring in manufacturing / process control. Examples include paper manufacture and conversion processes, multiple diverse coating applications and consumer product (adhesives on tape) manufacturing processes. TD-THz also allows nuclear gauge like measurements in industries that cannot use such gauges (e.g., PAT measurements for pharmaceutical manufacturing).It will be demonstrated that TD-THz measurements can be made at a much higher rate with better precision. The higher speed measurements allow better measurement of “cross machine” variations in web type manufacturing applications.Terahertz measurements extend past the capabilities of nuclear gauges. A significant advantage of the TD-THz is the ability to study multilayer and composite structures. With reflection geometry measurements, physical properties (e.g., mass, thickness) can be simultaneously determined for multiple layers of a sample. Non-contact “caliper” whole sample thickness measurements are demonstrated. This measurement does not require any prior knowledge of the sample’s composition.The TD-THz sensors are coupled through flexible fiber optic and electrical cables, allowing the sensors to be easily placed at process measurement points. All measurements are completely safe for personnel and samples.
____________________________


Advanced THz Materials for Nondestructive Evaluation (NDE)
New Phase 1 SBIR . This fits right in with Bob Sacks (Director, Molecular Beam Epitaxy, Picometrix LLC, an API Company) field of expertise. When acheived this will enhance all other projects and applications, and hopefully arouse interest from the TSA to go ahead and fund a TSA phase ll to adopt & integrate our Thz technology.

Proposal #:
F083-083-0876
DoD Submission #:
F083-083-0876
Phase:
I
Program:
SBIR
Proposal Title:
Advanced THz Materials for Nondestructive Evaluation (NDE)
AF Sol Topic #:
AF083-083
DoD Technology Area:
Materials / Processes
Solicitation #:
08.3
Gov't Managing Office:
RX
Agency:
AF
Gov't Sponsoring Office:
Topic Title:
Advanced THz Materials for Nondestructive Evaluation (NDE)
Award Details
Status:
Active
Amount:
100000
Contract:
FA8650-09-M-5425
Start:
1/12/2009 12:00:00 AM
End:
10/12/2009 12:00:00 AM
Annual Report FY:
Transition Success Story written?
Impact Story Submitted? No
HUBZone:
No
TRL Level:
TRL Application:
DTIC Rpt. Date:
DTIC Rpt. Num.:
DTIC Accession Number:
Firm Details
Firm:
Picometrix LLC
Socially & EconomicallyDisadvantaged Business?:
No
Address:
2925 Boardwalk
Woman Owned?:
No
Veteran Owned?:
No
City:
Ann Arbor
Disabled Veteran Owned?:
No
State:
MI
HBCU/MI:
No
Zip:
48104
HBCU/MI Name
Employees:
174
Contact Information
Project Manager Name:
Dr. David Zimdars
Project Manager Title:
Manager of Terahertz Development
Project Manager Phone:
(734) 864-5639
Project Manager Email:
dzimdars@picometrix.com

Corp Official Name:
Mr. Robin F. Risser
Corp Official Title:
President and General Manager
Corp Official Phone:
(734) 864-5605
Corp Official Email:
rrisser@picometrix.com
Appendix B
Abstract:In this Phase I project, we will demonstrate the improvement of the time-domain-terahertz (TD-THz) transmitter output power of low temperature grown indium gallium arsenide (LT-InGaAs) based epitaxial layer structures excited by the 1060 nm lasers, such as that employed in the T-RayTM 4000 TD-THz instrumentation system. Prior to this SBIR proposal, Picometrix has developed and commercialized 1060 nm driven LT-InGaAs photoconductive material with performance equivalent to traditional 800 nm driven low temperature grown gallium arsenide (LT-GaAs). The goal of this Phase I SBIR project will be to increase the electric field within the THz transmitting antenna at least 10 times over Picometrix’s current LT-InGaAs (or LT-GaAs) antenna by developing an enhanced LT-InGaAs photoconductive material. This emphasis on epitaxial growth and microfabrication during the first phase will provide the basis for a high-sensitivity THz transceiver that will make stand-off non-destructive evaluation (NDE) imaging possible during Phase II.
Benefits:In phase II we will package the enhanced “high performance” LT-InGaAs transmitter materials into the Picometrix’s standard telecommunications style miniature fiber pigtailed modules. These modules will provide greater than 10 times the electric field (and thereby a 10x increase in signal to noise) over the current generation of LT-InGaAs modules (or LT-GaAs modules). A Phase II prototype NDE stand-off imaging monostatic reflection TD-THz transceiver with 3-5 meter stand-off will be constructed, utilizing the new high performance modules. This will allow inspection of aircraft from the ground, without having to bring the instrument up near to the aircraft skin.
Keywords:Terahertz, Non Destructive Evaluation, molecular beam epitaxy, imaging

_____________________________________

FTIR, Sum Frequency and Terahertz-Materials Analysis
Basic Information
Abstract Number:
170-8


Author Name:
Jeffrey S White
Affiliation:
Picometrix LLC
Session Title:
FTIR, Sum Frequency and Terahertz-Materials Analysis
Event Type:
Oral
Event Title:
Time-Domain Terahertz Data Deconvolution Analysis for the Improved Measurement of Coating Thickness, Sample Mass, Density and other Applications
Presider(s):
Scandone, Marie
Start Time:
03:35 PM ( Slot # 9 )
Date:
03/08/2009
Location:
S504d
Keywords:
Data Analysis, Instrumentation, Paint/Coatings, Process ControlCo-Authors
Name
Affiliation
Chernovsky, Artur
Picometrix LLC
Fichter, Greg
Picometrix LLC
Zimdars, David
Picometrix LLCAbstract Content
This presentation will detail Time-Domain Terahertz (TD-THz) measurements and subsequent deconvolution analysis of THz time-domain data to significantly improve the measurement precision. These analysis methods directly improve the ability of TD-THz to make sample physical properties (e.g., basis weight, mass, thickness, density) for both laboratory and process control measurements. Additionally the method improves the appearance of data visualization (e.g., B-Scan) and the quality of imaging applications.TD-THz systems emit essentially single cycle pulses (1 ps width) of EM radiation. As an example, reflections of this pulse can be detected from all interfaces of a single or multilayer sample during the manufacturing process. The timing of these interfaces can be used to measure layer mass, thickness, density, etc. and thus provide process control or PAT capabilities.As will be presented, deconvolution analysis methods allow significantly improved robust measurement, with higher precision, of the time of the THz reflections. As the time-of-flight data is used to determine sample properties, this method directly leads to improved sample measurements. The analysis can be applied in real time and thus can be used in process control measurement applications (e.g., PAT for Pharmaceutical manufacturing).After deconvolution, a subsequent convolution with a prescribed pulse shape (e.g., Gaussian) significantly improves data visualization for B-Scans and for imaging applications.The TD-THz sensors are coupled through flexible fiber optic and electrical cables, allowing the sensors to be easily placed at process measurement points. All measurements are completely safe for personnel and samples.

________

Chemical Analysis of Art and Archaeological Objects
Basic Information
Abstract Number:
140-1


Author Name:
Jeffrey S White
Affiliation:
Picometrix LLC
Session Title:
Chemical Analysis of Art and Archaeological Objects
Event Type:
Oral
Event Title:
Time-Domain Terahertz Detection of Hidden Artworks
Presider(s):
Frederick, Kimberley
Start Time:
01:00 PM ( Slot # 1 )
Date:
03/08/2009
Location:
S505a
Keywords:
Art/Archaeology, Imaging, InstrumentationCo-Authors
Name
Affiliation
Duling, Irl
Picometrix LLC
Fichter, Greg
Picometrix LLC
Fukunaga, Kaori
NICT
Jackson, Jae B
Picometrix LLC
Menu, Michel
Louvre Museum
Whitaker, John
Picometrix LLC
Zimdars, David
Picometrix LLCAbstract Content
This presentation will detail Time-Domain Terahertz (TD-THz) investigations of detecting hidden works of art. Study of frescoes hidden under plaster in the 12th century Church of Saint-Jean-Bapitste in Vif France will be presented.Most dielectric materials are transparent to THz, thus it is possible to generate images through the plaster material. The reflectance and absorbance of materials used in frescoes and other art works (e.g., graphite) can vary in the THz region. Measurements through the plaster can record the reflection differences due to the differing pigments, binders, substrates and other materials of the artwork. Thus, the artwork under the plaster can be imaged. Studies of paintings, stained glass and parchment art objects will also be consideredThe presentation will also consider laboratory studies of THz properties of a wide range of the pigments, binders and other material used for both historic, recent and preservation artworks (THz spectra database).TD-THz systems emit essentially single cycle pulses (1 ps width) of EM radiation. Reflections of this pulse can be detected from all interfaces of a multilayer dielectric sample. The timing of these interfaces can be used to measure layer mass, thickness, etc.The TD-THz sensors are coupled through flexible fiber optic and electrical cables, allowing the sensors to be easily scanned over a very wide area. Umbilicals as long as 30 m have been delivered. All measurements are completely safe for personnel and samples.