Abstract-Terahertz-based subfemtosecond metrology of relativistic electron beams

R. K. Li, M. C. Hoffmann, E. A. Nanni, S. H. Glenzer, M. E. Kozina, A. M. Lindenberg, B. K. Ofori-Okai, A. H. Reid, X. Shen, S. P. Weathersby, J. Yang, M. Zajac, and X. J. Wang

https://journals.aps.org/prab/abstract/10.1103/PhysRevAccelBeams.22.012803

We demonstrate single-shot temporal characterization of relativistic electron bunches using single-cycle terahertz (THz) field streaking. A transverse deflecting structure consisting of a metal slit enables efficient coupling of the THz field and electron bunch. The intrinsically stable carrier envelope phase and strong gradient of the THz pulses allow simultaneous, self-calibrated determination of the time-of-arrival with subfemtosecond precision and bunch duration with single-femtosecond precision, respectively, opening up new opportunities for ultrafast electron diffraction as well as accelerator technologies in general.

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