O. V. Chefonov, A. V. Ovchinnikov, S. A. Evlashin, M. B. Agranat,
https://link.springer.com/article/10.1007/s10762-018-0537-8
Damage in a thin nickel film irradiated by subpicosecond pulses of terahertz (THz) radiation in the range of 1–3 THz at electric-field strengths up to 20 MV/cm at the center of a focal spot is observed. The damage threshold fluence is evaluated for single-pulse experiments. The damage pattern induced by multiple THz pulses has the appearance of a complex periodic structure in the form of elongated channels of metal film discontinuity that are perpendicular to the in-plane electric field direction of THz radiation.
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