Tuesday, November 14, 2017

Abstract-Characterization of an active metasurface using terahertz ellipsometry



Nicholas Karl, Martin S. Heimbeck,   Henry O. Everitt,   Hou-Tong Chen, Antoinette J. Taylor, Igal Brener, Alexander Benz, John L. Reno, Rajind Mendis,  Daniel M. Mittleman,

http://aip.scitation.org/doi/abs/10.1063/1.5004194

Switchable metasurfaces fabricated on a doped epi-layer have become an important platform for developing techniques to control terahertz (THz) radiation, as a DC bias can modulate the transmission characteristics of the metasurface. To model and understand this performance in new device configurations accurately, a quantitative understanding of the bias-dependent surface characteristics is required. We perform THz variable angle spectroscopic ellipsometry on a switchable metasurface as a function of DC bias. By comparing these data with numerical simulations, we extract a model for the response of the metasurface at any bias value. Using this model, we predict a giant bias-induced phase modulation in a guided wave configuration. These predictions are in qualitative agreement with our measurements, offering a route to efficient modulation of THz signals.

No comments: