Abstract-Measurement Uncertainty Model for Vector Network Analyzers With Frequency Extension Modules at Terahertz Frequencies

Masahiro Horibe

http://ieeexplore.ieee.org/document/7872422/

In this paper, we propose a new measurement uncertainty analysis method for scattering parameter measurements in waveguide devices operating in the frequency range from 750 GHz to 1.1 THz. The measurement uncertainty of vector network analyzers (VNAs) has been analyzed from the uncertainty of primary standards and repeatability. However, uncertainties in waveguide VNA measurements above 110 GHz were underestimated in the case of comparing two measurement systems at terahertz frequencies. Other uncertainty contributions, such as deviations in the connection torque and the effects of IF cables between the VNA and the frequency extension modules, have been incorporated in the new model. Using the new uncertainty model, results from two different systems, have been shown to agree within the uncertainty [1].