A repository & source of cutting edge news about emerging terahertz technology, it's commercialization & innovations in THz devices, quality control, process control, medical diagnostics, security, astronomy, communications, graphene, metamaterials, CMOS, compressive sensing, 3d printing, and the Internet of Nanothings. NOTHING POSTED IS INVESTMENT ADVICE! REPOSTED COPYRIGHT IS FOR EDUCATIONAL USE.
Tuesday, February 28, 2017
OT-LUNA BLOG- Webinar high resolution optical backscatter reflectometry
Join Luna for a FREE WEBINAR on improving optical component and system design, performance and quality
High-resolution optical backscatter reflectometry (OBR) has become a valuable tool in the design, test and diagnostics of fiber components, photonic integrated circuits (PICs) and short fiber networks. In much the same way standard OTDR is used for system-level test, high-resolution OBR can locate and identify issues (bends, breaks, bad splices, defects, interfaces, etc.) in components and short networks with sub-millimeter resolution long before they become problems.