Abstract-Robust mapping of electrical properties of graphene from terahertz time-domain spectroscopy with timing jitter correction

Patrick R. Whelan, Krzysztof Iwaszczuk, Ruizhi Wang, Stephan Hofmann, Peter Bøggild, and Peter Uhd Jepsen
obust mapping of electrical properties of graphene from terahertz time-domain spectroscopy with timing jitter correction

We demonstrate a method for reliably determining the electrical properties of graphene including the carrier scattering time and carrier drift mobility from terahertz time- domain spectroscopy measurements (THz-TDS). By comparing transients originating from directly transmitted pulses and the echoes from internal reflections in a substrate, we are able to extract electrical properties irrespective of random time delays between pulses emitted in a THz-TDS setup. If such time delays are not accounted for they can significantly influence the extracted properties of the material. The technique is useful for a robust determination of electrical properties from THz-TDS measurements and is compatible with substrate materials where transients from internal reflections are well-separated in time.

© 2017 Optical Society of America

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