Wednesday, October 12, 2016

Abstract-Ultrafast Terahertz Scanning Tunneling Microscopy with Atomic Resolution

Vedran Jelic, Krzysztof Iwaszczuk, Peter Nguyen, Christopher Rathje, Graham Hornig, Haille Sharum, James Hoffman, Mark Freeman, and Frank Hegmann

We demonstrate that THz-STM can probe single atoms on a silicon surface with simultaneous sub-nm and sub-ps resolution. THz-STM is established as a new technique for exploring high-field nonequilibrium tunneling phenomena with single atom precision.
© 2016 OSA
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