A repository & source of cutting edge news about emerging terahertz technology, it's commercialization & innovations in THz devices, quality & process control, medical diagnostics, security, astronomy, communications, applications in graphene, metamaterials, CMOS, compressive sensing, 3d printing, and the Internet of Nanothings. NOTHING POSTED IS INVESTMENT ADVICE! REPOSTED COPYRIGHT IS FOR EDUCATIONAL USE.
Thursday, August 18, 2016
US PATENT-MEASURING DEVICE FOR RELECTION MEASUREMENTS OF TEST OBJECTS AND METHOD FOR MEASURING RADIATION REFLECTED BY TEST OBJECTS
A measuring device for
reflection measurements of test objects includes a transmitter for emitting
radiation, a first collimation element for aligning the emitted radiation, a
first focusing element for focusing emitted radiation in relation to the test object,
and a receiver for detecting radiation reflected by the test object. There is a
second collimation element for aligning the reflected radiation, and a second
focusing element for focusing the reflected radiation in relation to the
receiver. At least two of the first and second collimation elements and first
and second focusing elements are separate from each other. Thus, a simple and
flexible design of the measuring device is achieved, which can be adapted to
the test object
No comments:
Post a Comment