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Sunday, March 8, 2015

Abstract-Modeling of terahertz metamaterial-sensors for simulation based on effect of resonance induction



Yehua Bie ; Jun Luo ; Weijun Li ; Xinyu Zhang ; An Ji ; Hongshi Sang ;Changsheng Xie
http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=2196191
Yehua Bie, Jun Luo, Weijun Li, Xinyu Zhang, Hongshi Sang
National Key Lab. of Science and Technology on Multispectral Information Processing (China)
An Ji
Institute of Semiconductors (China)
Changsheng Xie
Huazhong Univ. of Science and Technology (China)
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94460D (March 6, 2015); doi:10.1117/12.2084169


In order to observe more properties of an electrically resonant metamaterial-sensor, a single cubic unit of the matamaterial-sensor was simulated using the finite-element algorithm and Microwave Studios by CST. Meanwhile, an adaptive mesh refinement was used to ensure an accurate numerical solution with relatively short calculation time. In order to effectively conduct the simulation, some field monitors were also added to help the observation of electromagnetic properties of the unit. Through the electromagnetic simulation, the transmission and reflection spectra of the unit metamaterial-sensor were acquired. At the SRR gap, each kind of metamaterial-sensor structure presents an obvious resonant response at several THz frequency points. Simulation results indicated that the transmission was as low as 0.03 at ~0.79 THz. Other simulation results such as the surface current, the electric field, the electric energy density, and the power loss density, were also observed. By analyzing the simulation results, an idea to obtain the resonant strength in an indirect way was worked out and a way was found to realize the multispectral imaging in THz region. © (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Labels: Hongshi Sang, Jun Luo, metamaterials, sensors, Weijun Li, Xinyu Zhang, Yehua Bie

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