Tuesday, January 20, 2015

Ondax to showcase terahertz Raman spectroscopy system at SPIE BiOS and SPIE Photonics West 2015

THz-Raman spectroscopy systems from Ondax
THz-Raman spectroscopy systems combine chemical detection and structural analysis for forensic and scientific analyses. The newest system in the line is said to significantly reduce autofluorescence without the need for InGaAs detectors that are typically required to measure fluorescent materials. Using a 976 nm excitation source, the system delivers clear low-frequency Stokes and anti-Stokes spectral analysis over a range of ± 5–500 cm-1 when used with conventional Si detector-based spectrographs.

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