Thursday, December 4, 2014

Abstract-Subsurface Nanoimaging by Broadband Terahertz Pulse Near-Field Microscopy

Department of Electrical and Computer Engineering,POSTECH, San 31, Hyoja-dong, Nam-gu, Pohang, Kyungbuk 790-784, Korea
Nano Lett., Article ASAP
DOI: 10.1021/nl503998v
Publication Date (Web): December 1, 2014
Copyright © 2014 American Chemical Society

Combined with terahertz (THz) time-domain spectroscopy, THz near-field microscopy based on an atomic force microscope is a technique that, while challenging to implement, is invaluable for probing low-energy light-matter interactions of solid-state and biomolecular nanostructures, which are usually embedded in background media. Here, we experimentally demonstrate a broadband THz pulse near-field microscope that provides subsurface nanoimaging of a metallic grating embedded in a dielectric film. The THz near-field microscope can obtain broadband nanoimaging of the subsurface grating with a nearly frequency-independent lateral resolution of 90 nm, corresponding to ∼λ/3300, at 1 THz, while the AFM only provides a flat surface topography.

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