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New materials require new instruments to understand and measure their complex electronic properties, in particular when they do not directly correlate with atomic positions.
By integrating a lens and an antenna in an atomic force microscope much higher frequencies can be applied to locally measure the complex impedance. Compared to previous solutions a wider range of materials can be researched with this microscope. >> Read more...
Frequencies up to several THz can be applied without high radiation losses
The electronic properties of a wider range of materials can be measured, for instance, superconductors, polymers, magnetic materials and biological materials
A wide frequency can be applied, from 10 GHz to several THz
The assembly makes the cantilever a modular item which can be used with an existing Atomic Force Microscope