Applied Research & Photonics announces terahertz nano-scanner for sub-surface inspection and 3D imaging

My Note: I just saw this today but it appears to be dated back to 2012
http://www.laserfocusworld.com/articles/2012/11/thz-wafer-scanner-arp.html
http://www.arphotonics.net/terahertz_nanoscanner.htm

A
A paper for wafer inspection is here:
Effective testing for wafer reject minimization
by terahertz analysis and sub-surface imaging