Lake Shore Cryotronics will exhibit its materials characterisation solutions including a prototype terahertz (THz) system at SPIE Optics + Photonics 2013 on 25-29 August at the San Diego Convention Centre (booth 623) in San Diego, California (US). In addition to the new THz system, Lake Shore offers probe stations and Hall measurement systems (HMS) for complex measurements under variable temperature and magnetic field conditions.
The Optics + Photonics 2013 technical program will focus this year on nano-science and solar energy, among other topics. Researchers in spintronics, metamaterials, graphene, thin-film solar technology and other applications being discussed will have the opportunity to see a demonstration of Lake Shore’s THz material characterisation system. The prototype system uses non-contact, THz-frequency energy to enable researchers to explore phenomena in emerging electronic materials over a range of temperatures and magnetic fields.
Lake Shore has designed the THz system for use by material developers, including those in solar cell research. THz light can be used specifically to characterise electronic transport in transparent conductive oxides, including zinc-oxide, which can be important in future solar cell development. In addition, THz spectroscopy offers particular potential for characterising dielectric materials and certain multi-layer materials because THz light can pass through and pick up information from all layers.
Several key research facilities in the US are currently using alpha units of the THz system to gain valuable insight into molecular solids, thin films and other semiconductor devices. Earlier this year, Lake Shore was awarded a US Air Force STTR Phase I grant in support of the project.
The Lake Shore Model 8404 AC field system can be ordered with AC field HMS capability, which enables users to characterise materials with Hall mobilities down to 0.001 square centimetres per volt (cm2/V), lower than is possible using DC field HMS techniques. The company’s cryogenic probe stations enable reliable, unattended measurements of electrical, electro-optical, DC, RF and microwave properties of materials and test devices at cryogenic temperatures and under the application of magnetic fields up to 30,000 Gauss.
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