Yuji Sakai, Iwao Kawayama, Hidetoshi Nakanishi, and Masayoshi Tonouchi
https://www.osapublishing.org/abstract.cfm?uri=cleo_si-2017-SM4J.6&origin=search
Polarizations in GaN surfaces are visualized using terahertz emission microscopy. A non-radiative-inversion domain that is hardly distinguishable with photoluminescence imaging was clearly observed with this method.
© 2017 OSA
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