http://prb.aps.org/abstract/PRB/v86/i23/e235133 Gregory S. Jenkins1,2,*, Andrei B. Sushkov1,2,3, Don C. Schmadel1,2, M.-H. Kim1,2, Matthew Brahlek4, Namrata Bansal4, Seongshik Oh4, and H. Dennis Drew1,2,3
1Department of Physics, University of Maryland at College park, College Park, Maryland, 20742, USA
2Center for Nanophysics and Advanced Materials, University of Maryland at College park, College Park, Maryland, 20742, USA
3Materials Research Science and Engineering Center, University of Maryland at College park, College Park, Maryland, 20742, USA
4Department of Physics and Astronomy, The State University of New Jersey, Piscataway, New Jersey 08854, USA
We report gated terahertz Faraday angle measurements on epitaxial Bi2Se3 thin films capped with In2Se3. A plateau is observed in the real part of the Faraday angle at an onset gate voltage corresponding to no band bending at the surface, which persists into accumulation. The plateau is two orders of magnitude flatter than the step size expected from a single Landau level in the low-frequency limit, quantized in units of the fine structure constant. At 8 T, the plateau extends over a range of gate voltage that spans an electron density greater than 14 times the quantum flux density. Both the imaginary part of the Faraday angle and transmission measurements indicate dissipative off-axis and longitudinal conductivity channels associated with the plateau.
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