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Showing posts with label tomography. Show all posts
Showing posts with label tomography. Show all posts
Friday, March 2, 2018
Abstract-Probing the interatomic potential of solids with strong-field nonlinear phononics
A. von Hoegen, R. Mankowsky, M. Fechner, M. Först, A. Cavalleri
https://www.nature.com/articles/nature25484
Nonlinear optical techniques at visible frequencies have long been applied to condensed matter spectroscopy. However, because many important excitations of solids are found at low energies, much can be gained from the extension of nonlinear optics to mid-infrared and terahertz frequencies. For example, the nonlinear excitation of lattice vibrations has enabled the dynamic control of material functions. So far it has only been possible to exploit second-order phonon nonlinearities at terahertz field strengths near one million volts per centimetre. Here we achieve an order-of-magnitude increase in field strength and explore higher-order phonon nonlinearities. We excite up to five harmonics of the A1 (transverse optical) phonon mode in the ferroelectric material lithium niobate. By using ultrashort mid-infrared laser pulses to drive the atoms far from their equilibrium positions, and measuring the large-amplitude atomic trajectories, we can sample the interatomic potential of lithium niobate, providing a benchmark for ab initio calculations for the material. Tomography of the energy surface by high-order nonlinear phononics could benefit many aspects of materials research, including the study of classical and quantum phase transitions.
Thursday, April 21, 2016
Abstract-Terahertz imaging and tomography as efficient instruments for testing polymer additive manufacturing objects
J. B. Perraud, A. F. Obaton, J. Bou-Sleiman, B. Recur, H. Balacey, F. Darracq, J. P. Guillet, and P. Mounaix
https://www.osapublishing.org/ao/abstract.cfm?uri=ao-55-13-3462
Additive manufacturing (AM) technology is not only used to make 3D objects but also for rapid prototyping. In industry and laboratories, quality controls for these objects are necessary though difficult to implement compared to classical methods of fabrication because the layer-by-layer printing allows for very complex object manufacturing that is unachievable with standard tools. Furthermore, AM can induce unknown or unexpected defects. Consequently, we demonstrate terahertz (THz) imaging as an innovative method for 2D inspection of polymer materials. Moreover, THz tomography may be considered as an alternative to x-ray tomography and cheaper 3D imaging for routine control. This paper proposes an experimental study of 3D polymer objects obtained by additive manufacturing techniques. This approach allows us to characterize defects and to control dimensions by volumetric measurements on 3D data reconstructed by tomography.
© 2016 Optical Society of America
Full Article | PDF Article
Saturday, March 29, 2014
Abstract-Review of Terahertz Tomography Techniques
- J. P. Guillet,
- B. Recur,
- L. Frederique,
- B. Bousquet,
- L. Canioni,
- I Manek-Hönninger,
- P. Desbarats,
- P.
Terahertz and millimeter waves penetrate various dielectric materials, including plastics, ceramics, crystals, and concrete, allowing terahertz transmission and reflection images to be considered as a new imaging tool complementary to X-Ray or Infrared. Terahertz imaging is a well-established technique in various laboratory and industrial applications. However, these images are often two-dimensional. Three-dimensional, transmission-mode imaging is limited to thin samples, due to the absorption of the sample accumulated in the propagation direction. A tomographic imaging procedure can be used to acquire and to render three-dimensional images in the terahertz frequency range, as in the optical, infrared or X-ray regions of the electromagnetic spectrum. In this paper, after a brief introduction to two dimensional millimeter waves and terahertz imaging we establish the principles of tomography for Terahertz Computed tomography (CT), tomosynthesis (TS), synthetic aperture radar (SAR) and time-of-flight (TOF) terahertz tomography. For each technique, we present advantages, drawbacks and limitations for imaging the internal structure of an object.
Monday, September 3, 2012
Advantest Develops THz TOF Tomography Analysis System
http://thznetwork.net/index.php/archives/1621

Thin Film (Silicon on Insulator, SOI) Analysis Example
THz Technology Expanded to Li-ion Battery Electrode Analysis & Other Applications
Advantest Corporation today announced that it has developed a Terahertz (THz) time-of-flight (TOF) tomography analysis system utilizing short-pulse wide-band THz waves. The new system performs imaging and analysis of multi-layer coatings as thin as 10 µm, enabling the analysis of electrode films in li-ion batteries and layers within multi-coat automotive paint, among diverse new applications.
System Features
Advantest’s new system features a Cherenkov THz radiation source (*1) that employs non-linear crystals (LiNbO3;LN) (*2). The Cherenkov phase-matching method, utilizing a proprietary silicon lens developed by Advantest, enables the generation of short wave THz pulses and pseudo mono-pulses-ideal for reflective signal analysis-that cannot be generated with photoconductive elements. This feature facilitates contact-free imaging analysis down to an industry-leading 10 µm thickness.
Wider Applications for Advantest’s THz Wave Technology
Advantest launched sales of its first THz technology 3D imaging system in April 2010, and has since expanded this product family with innovative non-destructive, contact-free analysis solutions for ceramic products and pharmaceuticals. The company’s newly developed system applies its THz technology to the analysis of electrode films in li-ion batteries, multi-coat automotive paint, and other applications that are outside the scope of traditional ultrasonic and infrared analysis systems. Meanwhile, Advantest is continuing to develop its analysis technology to provide optimal solutions for the analysis of samples with greater functionality and more complex internal structures.
The new system will be exhibited at JASIS2012 (Japan Analytical & Scientific Instruments Show, formerly “JAIMA EXPO / SIS”), at the Makuhari Messe International Convention Complex near Tokyo, on September 5-7th, 2012.
(*1): Source where THz waves gain strength in a certain directional angle (Cherenkov radiation angle) and are irradiated. This occurs if the non-linear crystal refraction index for energized light waves is lower than the index for THz waves.
(*2): Optical elements that change electromagnetic waves from light wave frequency to THz frequency using non-linear optical effects.
(*2): Optical elements that change electromagnetic waves from light wave frequency to THz frequency using non-linear optical effects.
Thin Film (Silicon on Insulator, SOI) Analysis Example
? Echo-pulse from thin film interface

Measurement Capabilities
Wave frequency band: 7THz (S/N = 1)
Measureable film thickness: 10 µm or greater (for SOI thin films)
Wave frequency band: 7THz (S/N = 1)
Measureable film thickness: 10 µm or greater (for SOI thin films)
Source: Advantest.
Thursday, May 26, 2011
Innovations for tomography
http://www.physorg.com/wire-news/67860206/innovations-for-tomography.html
May 26th, 2011Stefan Hebele (left) received the Hugo Geiger Prize for his Diploma thesis and Anika Brahm received it for her Master‘s thesis. Credit: © private
The development of a handy X-ray tomograph achieved second place in the Hugo Geiger prize. The work that achieved the third place deals with a terahertz measuring system for spectral tomography that also measures how much radiation penetrates the object or is being reflected by it.Is the component ok or have errors been made during production? Are the inner structures built up as intended? This can be examined with an X-ray tomograph: it takes numerous X-ray images and combines them into cross-sections. This way, one gets a three dimensional model of the component without having to destroy it. Currently these apparatuses usually weigh uo to several tons, with even the lightest ones still weighing approximately 50 kilograms. During the work on his Diploma thesis at the Development Center for X-Ray Technology EZRT of the Fraunhofer Institute for Integrated Circuits IIS in Erlangen, Stefan Hebele developed a micro CT scanner that, weighing in at 19 kilograms, weighs approximately as much as a crate of beer bottles. At 350 by 300 by 230 millimeters, its dimensions are even smaller - the dimensions correspond more to a small postal package. »It is the first computer tomograph that, according to occupational safety law, may be carried by a single person, without reservation,« says Hebele, who achieved second place in the Hugo Geiger Prizes.
The operation could not be simpler: turn it on, connect a USB cable, open the cover, put the sample in it - and let's start. »The device is so handy that it can also be used for mobile applications. For example, it would be possible to offer mobile services. Instead of sending out samples of new materials or prototypes, companies could then simply have the service provider come on-site with its device. The results are available more quickly and it is more likely that confidentiality will be maintained than would be the case if the sample is sent out,« says Hebele. The price is yet another advantage: costing € 55,000, the X-ray tomograph is far less costly than its multi-ton colleagues that can be had for prices that start well above € 100,000. Almost any samples that do not exceed a size of four by four by four centimeters can be examined.
Simultaneous measurement of transmission and reflection
Anika Brahm from the Fraunhofer Institute for Applied Optics and Precision Engineering IOF in Jena, Germany achieved 3rd place. In her Master's thesis, she, too, was working on a type of tomography and developed a terahertz measuring system that makes it possible to determine transmitted and reflected light in a single measuring sweep. »Terahertz radiation is in the frequency range between infrared and microwave radiation and can penetrate materials such as wood, textiles and plastics,« she explains. Current processes irradiate the components, packages or other objects and measure how much radiation penetrates the object or how much is being reflected by it. Both methods contain identical information, but not all materials can be examined equally well with one of the versions. For example, metals do not allow terahertz pulses to penetrate them, but layers affixed to them can be examined by means of reflection. »Since we are able to utilize transmission as well as reflection with the measuring system we developed, we are more flexible in the examination,« says Anika Brahm. One more innovation: not only does the system help to find structural defects or other material defects, but it also examines the characteristic frequency spectrum. Such a spectrum tells the researchers what kind of material they are dealing with - for example, they are able to detect explosives in packages this way. Brahm summarizes: »Since the machine determines the spectral information in three dimensions for the first time, we are able to state exactly what kind of material is located where."
Provided by Fraunhofer-Gesellschaft
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