Abstract-Characterization of Thin Metal Films Using Terahertz Spectroscopy

 Zhiyong Wang,  Yunhui Han, Xu, Lin Chen,  Chuanwei Li,  Liang Wu, Weili Zhang,

http://ieeexplore.ieee.org/document/8254401/

A theoretical model is presented to simulate the transmission of thin metal films. Using terahertz spectroscopy, the two key characteristic parameters, conductivity and thickness, are determined simultaneously by fitting the experimental data to the theoretical model. Three different metal films, aluminum, copper, and silver, are investigated. The measured conductivities are significantly less than the bulk values. The sample thicknesses obtained are consistent with those estimated by the quartz thickness monitor.

Abstract-Graphene as broadband terahertz antireflection coating

Zhou, Yixuan
State Key Lab Incubation Base of Photoelectric Technology and Functional Materials, National Photoelectric Technology, Functional Materials and Application of Science and Technology International Cooperation Center, and Institute of Photonics & Photon-Technology, Northwest University, Xi'an 710069, China
Xu, Xinlong ; Hu, Fangrong ; Zheng, Xinliang ; Li, Weilong ; Zhao, Penghui ; Bai, Jintao ;Ren, Zhaoyu
http://ieeexplore.ieee.org/xpl/abstractAuthors.jsp?arnumber=6731433

We examined the potential of stacked multilayer graphene as broadband terahertz (THz) antireflection coating based on the impedance matching effect in experiment and theory. The reflected pulses from the quartz and silicon substrates were observed to change with the layer number and doping concentration of the graphene coating. Remarkable broadband impedance matching was achieved due to optimized THz conductivity. Theoretical analysis based on Drude model and thin film Fresnel coefficients have been used to explain the experimental phenomena, which indicated the shift of Fermi level caused by chemical doping. This work paves the way for graphene-based broadband THz antireflection coating.