LUNA Blog-TeraMetrix™ multilayer thickness measurement featured at NP®

http://lunainc.com/terametrix-multilayer-thickness-measurement-featured-np/

While our last post was about our participation in a very focused event concentrating on thin wall packaging, we are now announcing that we will be participating in one of the major plastic industry events.

NPE^® is a “must-attend” event for a wide array of people from across the plastics supply chain and the end user market.  Held every other year in Orlando, NPE is produced by the Plastics Industry Association, and draws an average attendance of 65,000, and over 2,000 exhibiting companies.

While we do not have a booth of our own, TeraMetrix (a division of Luna) is proud to announce that their multilayer thickness measurement solution will be presented and/or demonstrated in a number of exhibit booths.  Whether it is a demonstration of online barrier layer measurement at IMDvista (booth S11057), or presentation of an integrated web process control solution at Thermo Fisher Scientific (booth S28161) or Indev-ACT (booth S15131), or measurement of extruded pipe thickness at iNOEX (booth W3191), TeraMetrix T-Gauge^® sensors are being used to improve product quality and reduce waste.

The T-Gauge sensor is optimized for the production environment, with a robust, lightweight sensor head suitable for scanning.  The gauge carries UL, CE and FCC certifications, and a Class I Division 1 certified sensor is available for explosive environments.  Its high-speed measurement rate (up to 1000 Hz) and high precision provide unsurpassed performance in online applications.

While a demonstration of our T-Gauge capability is always impressive, it is more important to provide a complete solution that can be easily integrated into a manufacturing process.  In conjunction with our partners, we are able to supply just such a solution.

Margaret Murdock (General Manager), as well as John Riccardi (Global Sales), Steve Williamson (Director of Engineering) and Irl Duling (Business Development) will be available during the show to support our integrators, and to develop relationships with new customers. 

John Riccardi comments on NPE, “Eight years ago TeraMetrix introduced the first industrial terahertz platform for real time plant floor deployment.  Since then our channel partners have deployed dozens of T-Gauge systems covering a wide range of plastics applications.   Now TeraMetrix offers disruptive solutions that perform multi-layer measurements previously resolved only with complex arrays of nucleonic or other more costly inefficient technology.” 

We invite you to visit our partners at NPE or contact us directly at terahertzsales@lunainc.com.

Opinion- Advanced Photonix advancing THz into the paper industry

Opinion/Commentary
Last year Advanced Photonix, presented a cutting edge paper at the 2011 PaperCon Convention, which demonstrated the advantages to be found in the use of Terahertz for industrial quality control in paper processing/manufacturing. (That paper which is in pdf format and too large to post here, is linked below.)


While not presenting any new papers this year at PaperCon, it is my understanding that John Riccardi, sales manager for Advanced Photonix, along with API's recently added value added partners, ThermoFisher, and Automation and Control Technology, Inc. (ACT), are not at this year's PaperCon, but are talking to paper industrialists. I anticipate that hearing about the benefits of using THz from multiple reputable sources will lead to new VAR's and sales of the recently developed T-Gauge. for use in the paper industry. Even if no immediate sales are announced it is my opinion that these efforts demonstrate that once again, API, is  making progress in bringing awareness about and  advancing Terahertz as a break-through advance over existing technology for industrial quality control in the paper industry, with many more to follow.
These are my opinions, and please do your own due diligence before investing in any company.


http://www.tappi.org/Downloads/Conference-Papers/2011/2011-PaperCon-Conference/11PAP35.aspx

(also see: http://www.blogger.com/post-edit.g?blogID=124073320791841682&postID=5531448771814871403 )

Advanced Photonix, uses pulsed terahertz to win best paper coating award at PaperCon

 

 

Tech Channel :Papermaking

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TAPPI awards Advanced Photonix and Appleton with best coating papers awards at PaperCon 2011

NORCROSS, GA, May 25, 2011 (Press Release) - #39;s Coating and Graphic Arts Division, organizers of the Coating program at PaperCon 2011 has announced the best coating papers presented at the conference in Covington, KY on May 3, 2011. The best paper overall was awarded to Jeffrey White, Irl Duling and John J. Riccardi of Advanced Photonix, and Jason Morgan, Mike Friese of Appleton:

"Use of a Pulsed Terahertz Sensor for Coat Weight, Noncontact Caliper Thickness and Moisture"

The paper discussed a novel technology applied to on-line measurement using pulsed terahertz lightwave. A new sensor, with a non-radioactive source technology measures weight, coat weight, moisture, and non-contact caliper. The award is accompanied by a $1000 stipend to be given in the recipient's name to a college or university of his/her choice to be conferred as a scholarship.

Also recognized at the conference was the best student paper, awarded to Roger Bollstrom of Abo Akademi University:

"Top Layer Coatability on Barrier Coatings"

This paper examined the effects of barrier coating formulation and post treatments on barrier surface wettability. Its intent is to show that barrier coatings may be overcoated. The Best Student Paper award includes a $1000 stipend, the Louis Georgevits Memorial Prize, funded by the Louis Georgevits Foundation.

"We were very pleased with the high quality work presented at this year's conference" said Jim Niemiec of NewPage, the Coating Conference Chair, and "this is our second year organizing a ‘best papers' session and it has proven to be highly popular."

The Coating Best Paper Awards are selected by a subcommittee of the TAPPI Coating and Graphic Arts Technical Program Committee.