Showing posts with label Jacek Arabski. Show all posts
Showing posts with label Jacek Arabski. Show all posts

Monday, August 31, 2020

Abstract-Ultrafast terahertz magnetometry


Wentao Zhang, Pablo Maldonado, Zuanming Jin, Tom S. Seifert, Jacek Arabski, Guy Schmerber, Eric Beaurepaire, Mischa Bonn, Tobias Kampfrath, Peter M. Oppeneer, Dmitry Turchinovich


https://www.nature.com/articles/s41467-020-17935-6

A material’s magnetic state and its dynamics are of great fundamental research interest and are also at the core of a wide plethora of modern technologies. However, reliable access to magnetization dynamics in materials and devices on the technologically relevant ultrafast timescale, and under realistic device-operation conditions, remains a challenge. Here, we demonstrate a method of ultrafast terahertz (THz) magnetometry, which gives direct access to the (sub-)picosecond magnetization dynamics even in encapsulated materials or devices in a contact-free fashion, in a fully calibrated manner, and under ambient conditions. As a showcase for this powerful method, we measure the ultrafast magnetization dynamics in a laser-excited encapsulated iron film. Our measurements reveal and disentangle distinct contributions originating from (i) incoherent hot-magnon-driven magnetization quenching and (ii) coherent acoustically-driven modulation of the exchange interaction in iron, paving the way to technologies utilizing ultrafast heat-free control of magnetism. High sensitivity and relative ease of experimental arrangement highlight the promise of ultrafast THz magnetometry for both fundamental studies and the technological applications of magnetism.

Thursday, January 25, 2018

Abstract- Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction



Keno L. Krewer, Zoltan Mics, Jacek Arabski, Guy Schmerber, Eric Beaurepaire, Mischa Bonn, and Dmitry Turchinovich
We present a new approach for accurate terahertz time-domain spectroscopy of thin films deposited on dielectric substrates. Our approach relies on the simultaneous measurement of film and substrate, allowing for 15 nm—precise determination of the thickness variation between the sample and reference. Our approach allows for unprecedentedly accurate determination of the terahertz conductivity of the thin film. We demonstrate our approach on a 10 nm thin iron film deposited on a 500 μm MgO substrate. We determine the Drude momentum relaxation time in iron to within 0.15 fs uncertainty.
© 2018 Optical Society of America