Showing posts with label Borja Vidal. Show all posts
Showing posts with label Borja Vidal. Show all posts

Wednesday, October 25, 2017

Abstract-Printing sub-THz wire grid polarizers using a composite liquid metal ink



Margherita M. P. ColleoniQian WangJing LiuBorja Vidal

https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10103/101031T/Printing-sub-THz-wire-grid-polarizers-using-a-composite-liquid/10.1117/12.2251491.pdf?SSO=1

A low-cost method to ink-jet print terahertz polarizers is presented. A liquid metal printer is used to deliver an eutectic Gallium and Indium alloy (EGaIn24.5) onto polyvinyl chloride film substrates to create flexible wire grid polarizers (10 x 20 mm) in the sub-THz band with a nominal pitch of 200 μm and 300 μm, respectively. A Terahertz Time Domain Spectroscopy (THz-TDS) setup has been used to characterize the polarizers. The experimental results have been compared with FIT (Finite Integration Technique) simulations (CST Studio) showing good agreement. The characterization of the polarizers shows an extinction ratio up to 14 dB in the 0.1-0.7 THz and low loss (<1 dB). A microscopic characterization of the polarizers shows a variance in the line spacing of about 9%. This fabrication method allows a quick and cost-effective approach for the development of sub-THz polarizers to be used in polarization-resolved spectroscopy, polarimetric quality monitoring sensors and the characterization of THz components.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only

Tuesday, February 4, 2014

Abstract-Birefringence measurement in the terahertz range based on double Fourier analysis


Federico Sanjuan, Alexander Bockelt, and Borja Vidal  »View Author Affiliations
Optics Letters, Vol. 39, Issue 4, pp. 809-812 (2014)
http://dx.doi.org/10.1364/OL.39.000809
A method for obtaining the average refractive indexes of a birefringent material in the terahertz region in a single measurement with a standard terahertz time-domain spectrometer is presented. The method is based on processing the frequency-domain interference between terahertz pulses and echoes through the Fourier transform of the terahertz spectrum. The technique also allows the determination of the optical axis orientation of the material by making two measurements with different angles of the sample optical axis.
© 2014 Optical Society of America