Showing posts with label Axel J. Zeitler. Show all posts
Showing posts with label Axel J. Zeitler. Show all posts

Wednesday, July 15, 2015

Abstract-Impact of processing conditions on inter‐tablet coating thickness variations measured by terahertz in-line sensing




Lin, Hungyen and May, Robert K. and Evans, Michael J. and Zhong, Shuncong and Gladden, Lynn F. and Shen, Yaochun and Zeitler, J. Axel 

http://strathprints.strath.ac.uk/53773/

A novel in-line technique utilising pulsed terahertz radiation for direct measurement of the film coating thickness of individual tablets during the coating process was previously developed and demonstrated on a production-scale coater. Here, we use this technique to monitor the evolution of tablet film coating thickness and its inter-tablet variability during the coating process under a number of different process conditions that have been purposefully induced in the production-scale coating process. The changes that were introduced to the coating process include removing the baffles from the coater, adding uncoated tablets to the running process, halting the drum, blockage of spray guns and changes to the spray rate. The terahertz sensor was able to pick up the resulting changes in average coating thickness in the coating drum and we report the impact of these process changes on the resulting coating quality.

Thursday, June 11, 2015

Abstract-Quantifying pharmaceutical film coating with optical coherence tomography and terahertz pulsed imaging: an evaluation


Hungyen Lin,Yue Dong, Yaochun Shen, Axel J. Zeitler,
https://www.repository.cam.ac.uk/handle/1810/248408?show=full

Spectral domain optical coherence tomography (SD-OCT) has recently attracted a lot of interest in the pharmaceutical industry as a fast and non-destructive modality for quantification of thin film coatings that cannot easily be resolved with other techniques. Due to the relative infancy of this technique, much of the research to date has focused on developing the in-line measurement technique for assessing film coating thickness. To better assess OCT for pharmaceutical coating quantification, this paper evaluates tablets with a range of film coating thickness measured using OCT and terahertz pulsed imaging (TPI) in an off-line setting. In order to facilitate automated coating quantification for film coating thickness in the range of 30 to 200 μm, an algorithm that uses wavelet denoising and a tailored peak finding method is proposed to analysis each of the acquired A-scan. Results obtained from running the algorithm reveal an increasing disparity between the TPI and OCT measured intra-tablet variability when film coating thickness exceeds 100 μm. The finding further confirms that OCT is a suitable modality for characterising pharmaceutical dosage forms with thin film coatings while TPI is well suited for thick coatings.