https://link.springer.com/article/10.1007/s10762-020-00692-4
To meet increasingly demanding technological needs in modern security and industrial applications involving rapid close-range screening, we have developed a 100-GHz linear scanner. Having incorporated a novel approach in terahertz sensing and an advanced IMPATT-diode signal generating technique, the proposed system offers an efficient non-destructive testing (NDT) solution that is absolutely safe, fast, highly portable, and cost-effective. The test results demonstrate outstanding capability of the scanner to provide continuous, high-throughput security screening of mail. The system can perform real-time imaging with effective resolution approaching 5 mm at conveyor speeds of up to 15 m/s.
