Kenta Suzuki, Kenichi Oguchi, Yasuaki Monnai, Makoto Okano, Shinichi Watanbe,
https://iopscience.iop.org/article/10.7567/1882-0786/ab12fc
We develop a terahertz electric-field vector imaging system that uses the rotating polarizer technique. The imaging system is used to investigate the polarization-dependent optical response of a patterned indium–tin–oxide (ITO) film deposited on a glass substrate. While ITO is transparent for the near-infrared probe light, it acts as a metal for terahertz light. Therefore, a polarization-dependent diffraction can be observed at the edge of the ITO thin film; only electric-field components perpendicular to the edge boundary behind the ITO layer. By comparison with a numerical simulation, we reveal the polarization dependence of this so-called knife-edge diffraction.
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