A. N. Tcypkin, S. E. Putilin, M. C. Kulya, M. V. Melnik, A. A. Drozdov, V. G. Bespalov, X.-C. Zhang, R. W. Boyd, S. A. Kozlov
https://link.springer.com/article/10.3103%2FS1062873818120237
A modification of the Z-scan technique for measuring nonlinear refractive index n2 in the terahertz spectral region is proposed. Measurements are made at a broadband terahertz radiation intensity of 0.8 × 109 W cm−2. Coefficient n2 = 2.5 × 10−11 cm2 W−1 is estimated for semiconductor crystalline ZnSe.
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