Navaneetha K. Ravichandran, Hang Zhang, and Austin J. Minnich
The reflection of waves from rough surfaces is a fundamental process that plays a role in diverse fields such as optics, acoustics, and seismology. While a quantitative understanding of the reflection process has long been established for many types of waves, the precise manner in which thermal phonons of specific wavelengths reflect from atomically rough surfaces remains unclear owing to limited control over terahertz-frequency phonon generation and detection. Knowledge of these processes is critical for many applications, however, and is particularly important for recent attempts to create novel materials by coherently interfering thermal phonons. Here, we report measurements of a key property for these efforts, the phonon-wavelength-dependent specularity parameter, which describes the probability of specular reflections of thermal phonons at a surface. Our experiments show evidence of specular surface reflections of terahertz thermal phonons in our samples around room temperature and indicate a sensitivity of these reflections to surface imperfections on the scale of just 2–3 atomic planes. Our work demonstrates a general route to probe the microscopic interactions of thermal phonons with surfaces that are typically inaccessible with traditional experiments.
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