Wednesday, May 16, 2018

Abstract-Bias Dependence of Laser Terahertz Emission Nanoscopy

Angela Pizzuto, Pernille Klarskov, and Daniel M. Mittleman

We demonstrate depletion of terahertz emission from semiconductors by applying a DC bias between a substrate and an AFM probe operating in tapping mode. The depletion is strongly dependent on the probe tapping amplitude.
© 2018 The Author(s)

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