Abstract-Dielectric Properties of Metal-Organic Frameworks Probed via Synchrotron Infrared Reflectivity
Matthew R. Ryder,
Zhixin Zeng,
Yueting Sun,
Irina Flyagina,
Kirill Titov,
E.M. Mahdi,
Thomas D. Bennett,
Bartolomeo Civalleri,
Chris S. Kelley,
Mark D. Frogley,
Gianfelice Cinque,
Jin-Chong Tan
We present the frequency-dependant (dynamic) dielectric response of a group of topical polycrystalline zeolitic imidazolate-based metal-organic framework (MOF) materials in the extended infrared spectral region. Using synchrotron-based FTIR spectroscopy in specular reflectance, in conjunction with density functional theory (DFT) calculations, we have revealed detailed structure-property trends linking the THz region dielectric response to framework porosity and structural density. The work demonstrates that MOFs are promising candidate materials not only for low-\k{appa} electronics applications but could also be pioneering for terahertz (THz) applications, such as next-generation broadband communications technologies.
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