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Sunday, July 31, 2016
Abstract-Terahertz 3D Imaging of Nanomaterial Interfaces for Sub-nanometer Analysis
Sub-nanometer imaging with size measurement was achieved via terahertz route. We describe a new technique of 3D imaging with layer-by-layer inspection capability in a non-contact fashion with resolution less than a nanometer. A high power, CW terahertz energy is utilized for scanning a specimen.