- Precision Hall effect measurement systems, available with AC field Hall option for measuring high-resistivity, low-mobility materials down to 0.001 cm^2/Vs. These systems are ideal for characterizing novel photovoltaic materials.
- Sensors and instruments for stable, reliable low-temperature measurements.
- Programmable DC current sources for measuring resistive and semiconductor devices, and for LED brightness testing.
Tuesday, August 4, 2015
Photovoltaic Material Measurement Focus of Lake Shore SPIE Conference Exhibit
Lake Shore Cryotronics, a leading innovator in solutions for measurement over a wide range of temperature and magnetic field conditions, will be discussing their cryogenic probe stations and terahertz (THz) based materials characterization system at the SPIE Optics + Photonics Exhibition in San Diego, August 11 – 13.
Used to measure electro-optical, magneto-transport, DC, RF or microwave properties, cryogenic probe stations are versatile platforms for studying materials and early-stage devices as a function of temperature and in high magnetic field. Lake Shore probe stations offer a convenient way to reliably measure devices, as well as novel photovoltaic materials, in a tightly controlled environment (at temperatures as low as 1.6 K, depending on the model). Applications include research of optical properties of nanostructured materials as well as semiconductor optoelectronic devices and materials.
A number of probe station versions are available from Lake Shore, including cryogen-free CCR (closed-cycle refrigerator) models, the Model PS-100 station designed for fast delivery and setup, and the Model TTPX, an affordable, entry-level probe station. The Model TTPX will be on display in Lake Shore’s booth at the exhibition.
Also, for those interested in performing high-frequency contact measurements as a function of temperature and field in their probe station, Lake Shore will be discussing their upcoming THz-frequency contact probing arm for cryogenic applications. This unique option will enable precise on-wafer probing of millimeter wave devices and materials at 75 GHz and higher frequencies.
Attendees can also learn about the 8500 Series THz system for materials characterization. The fully integrated, non-contact measurement platform uses THz-frequency energy and a low-temperature, high-field cryostat to measure material spectroscopic responses across a wide range of frequencies, temperatures and field strengths. It is unique because it uses a continuous wave (CW) spectrometer for higher spectral resolution, producing spectral profiles that can reveal interesting phenomena not visible with conventional characterization techniques. These are especially useful in transparent conductive oxide and dielectric material research.
Also at SPIE Optics + Photonics, Lake Shore will answer questions about their:
For more information, visit SPIE Optics + Photonics Booth 215 or http://www.lakeshore.com.