Received 15 October 2012; published 15 February 2013
We propose and simulate the relativistic Doppler reflection of terahertz (THz) radiation normally incident on a plasma front in a semiconductor medium, resulting in a significant frequency upshift for the reflected radiation. The plasma front is generated by linear interband excitation of the semiconductor by a counterpropagating femtosecond optical pulse. High-resistivity silicon is identified as an ideal medium for experiments, as it possesses a desirable optical penetration depth, upshift factor, and low THz absorption and dispersion. The depletion of the optical pump pulse results in a spatiotemporal plasma profile, which leads to results that go beyond the existing analytic theory. We employ one-dimensional finite-difference time-domain simulations to predict the reflected THz pulses vs a range of realistic experimental parameters. The results indicate that a significant frequency upshift can be expected for both conventional and ultrabroadband THz pulses, and that this technique may be suitable to provide higher-bandwidth THz radiation extending into the midinfrared.
©2013 American Physical Society
URL:
http://link.aps.org/doi/10.1103/PhysRevB.87.085203
DOI:
10.1103/PhysRevB.87.085203
PACS:
42.65.Re, 78.47.J-, 42.72.Ai, 78.20.Bh
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