Wednesday, December 5, 2012

Abstract-Ultrafast X-ray pulse characterization at free-electron lasers



I. Grguraš, A. R. Maier, C. Behrens, T. Mazza, T. J. Kelly, P. Radcliffe, S. Düsterer, A. K. Kazansky, N. M. Kabachnik, Th. Tschentscher, J. T. Costello, M. Meyer, M. C. Hoffmann, H. Schlarb & A. L. Cavalieri

http://www.nature.com/nphoton/journal/v6/n12/full/nphoton.2012.276.html

The ability to fully characterize ultrashort, ultra-intense X-ray pulses at free-electron lasers (FELs) will be crucial in experiments ranging from single-molecule imaging to extreme-timescale X-ray science. This issue is especially important at current-generation FELs, which are primarily based on self-amplified spontaneous emission and radiate with parameters that fluctuate strongly from pulse to pulse. Using single-cycle terahertz pulses from an optical laser, we have extended the streaking techniques of attosecond metrology to measure the temporal profile of individual FEL pulses with 5 fs full-width at half-maximum accuracy, as well as their arrival on a time base synchronized to the external laser to within 6 fs r.m.s. Optical laser-driven terahertz streaking can be utilized at any X-ray photon energy and is non-invasive, allowing it to be incorporated into any pump–probe experiment, eventually characterizing pulses before and after interaction with most sample environments.

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