October 30, 2012 2:30PM to 3:30PM
Presenter:
Don J. Roth, NASA Glenn Research Center
Location:
Building 208, Room C234
Type:
Seminar
Series:
Nuclear Engineering Division Seminar
Abstract:
This talk covers recent technical efforts in the X-ray micro-computed tomography (uCT) and terahertz areas at NASA Glenn Research Center. The first part of the talk will discuss the uCT work being done for the Advanced Stirling Radioisotope Generator program in which NASA is partnering with DOE, Lockheed-Martin, and Sunpower Corp. The focus of this program is to develop an ultra high efficiency, lower mass Stirling convertor for use with a radioisotope, reactor, or solar concentrator heat source for power on beyond-earth-orbit space missions. A high resolution micro-CT system has been assembled and is being used to provide optimal characterization for ultra-thin wall space components in this program.
This talk covers recent technical efforts in the X-ray micro-computed tomography (uCT) and terahertz areas at NASA Glenn Research Center. The first part of the talk will discuss the uCT work being done for the Advanced Stirling Radioisotope Generator program in which NASA is partnering with DOE, Lockheed-Martin, and Sunpower Corp. The focus of this program is to develop an ultra high efficiency, lower mass Stirling convertor for use with a radioisotope, reactor, or solar concentrator heat source for power on beyond-earth-orbit space missions. A high resolution micro-CT system has been assembled and is being used to provide optimal characterization for ultra-thin wall space components in this program.
This talk will discuss many aspects of the development of the CT scanning for this type of component, including CT system overview; inspection requirements; process development, software utilized and developed to visualize, process, and analyze results; calibration sample development; results on actual samples; correlation with optical/SEM characterization; CT modeling; and development of automatic flaw recognition software. In the second part of the talk, the assembly of a terahertz system and its use in computed tomography and reflection modes for NASA thermal and environmental protection system materials will be briefly described. The THz tomography system can inspect samples as large as 0.0283 m3 (1 ft3) with no safety concerns as for x-ray computed tomography. The reflection mode THz capability is being investigated for use in simultaneously characterizing thickness and microstructural quality in coatings with the same set of measurements.
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