Showing posts with label Tetsuo Iwata. Show all posts
Showing posts with label Tetsuo Iwata. Show all posts

Thursday, August 31, 2017

Abstract-Scan-less hyperspectral dual-comb single-pixel-imaging in both amplitude and phase



Kyuki Shibuya, Takeo Minamikawa, Yasuhiro Mizutani, Hirotsugu Yamamoto, Kaoru Minoshima, Takeshi Yasui, and Tetsuo Iwata

https://www.osapublishing.org/oe/abstract.cfm?uri=oe-25-18-21947

We have developed a hyperspectral imaging scheme that involves a combination of dual-comb spectroscopy and Hadamard-transform-based single-pixel imaging. The scheme enables us to obtain 12,000 hyperspectral images of amplitude and phase at a spatial resolution of 46 µm without mechanical scanning. The spectral resolution given by the data point interval in the frequency domain is 20 MHz and the comb mode interval is 100 MHz over a spectral range of 1.2 THz centered at 191.5 THz. As an initial demonstration of our scheme, we obtained spectroscopic images of a standard test chart through an etalon plate. The thickness of an absorptive chromium-coated layer on a float-glass substrate was determined to be 70 nm from the hyperspectral phase images in the near-infrared wavelength region.
© 2017 Optical Society of America

Thursday, June 16, 2016

Abstract-Dynamic terahertz spectroscopy of gas molecules mixed with unwanted aerosol under atmospheric pressure using fibre-based asynchronous-optical-sampling terahertz time-domain spectroscopy



http://www.nature.com/articles/srep28114

Terahertz (THz) spectroscopy is a promising method for analysing polar gas molecules mixed with unwanted aerosols due to its ability to obtain spectral fingerprints of rotational transition and immunity to aerosol scattering. In this article, dynamic THz spectroscopy of acetonitrile (CH3CN) gas was performed in the presence of smoke under the atmospheric pressure using a fibre-based, asynchronous-optical-sampling THz time-domain spectrometer. To match THz spectral signatures of gas molecules at atmospheric pressure, the spectral resolution was optimized to 1 GHz with a measurement rate of 1 Hz. The spectral overlapping of closely packed absorption lines significantly boosted the detection limit to 200 ppm when considering all the spectral contributions of the numerous absorption lines from 0.2 THz to 1 THz. Temporal changes of the CH3CN gas concentration were monitored under the smoky condition at the atmospheric pressure during volatilization of CH3CN droplets and the following diffusion of the volatilized CH3CN gas without the influence of scattering or absorption by the smoke. This system will be a powerful tool for real-time monitoring of target gases in practical applications of gas analysis in the atmospheric pressure, such as combustion processes or fire accident.

Monday, January 11, 2016

Abstract-Real-Time Determination of Absolute Frequency in Continuous-Wave Terahertz Radiation with a Photocarrier Terahertz Frequency Comb Induced by an Unstabilized Femtosecond Laser


Takeo Minamikawa, Kenta Hayashi, Tatsuya Mizuguchi, Yi-Da Hsieh, Dahi Ghareab Abdelsalam, Yasuhiro Mizutani, Hirotsugu Yamamoto, Tetsuo Iwata, Takeshi Yasui,



A practical method for the absolute frequency measurement of continuous-wave terahertz (CW-THz) radiation uses a photocarrier terahertz frequency comb (PC-THz comb) because of its ability to realize real-time, precise measurement without the need for cryogenic cooling. However, the requirement for precise stabilization of the repetition frequency (f rep) and/or use of dual femtosecond lasers hinders its practical use. In this article, based on the fact that an equal interval between PC-THz comb modes is always maintained regardless of the fluctuation in f rep, the PC-THz comb induced by an unstabilized laser was used to determine the absolute frequency f THz of CW-THz radiation. Using an f rep-free-running PC-THz comb, the f THz of the frequency-fixed or frequency-fluctuated active frequency multiplier chain CW-THz source was determined at a measurement rate of 10 Hz with a relative accuracy of 8.2 × 10−13 and a relative precision of 8.8 × 10−12 to a rubidium frequency standard. Furthermore, f THz was correctly determined even when fluctuating over a range of 20 GHz. The proposed method enables the use of any commercial femtosecond laser for the absolute frequency measurement of CW-THz radiation.

Tuesday, June 2, 2015

Abstract-Adaptive sampling dual terahertz comb spectroscopy using dual free-running femtosecond lasers

  • Takeshi Yasui,
  • Ryuji Ichikawa,
  • Yi-Da Hsieh,
  • Kenta Hayashi,
  • Harsono Cahyadi,
  • Francis Hindle,
  • Yoshiyuki Sakaguchi,
  • Tetsuo Iwata,
  • Yasuhiro Mizutani,
  • Hirotsugu Yamamoto,
  • Kaoru Minoshima
  • Hajime Inaba
  • http://www.nature.com/srep/2015/150602/srep10786/full/srep10786.html

    Terahertz (THz) dual comb spectroscopy (DCS) is a promising method for high-accuracy, high-resolution, broadband THz spectroscopy because the mode-resolved THz comb spectrum includes both broadband THz radiation and narrow-line CW-THz radiation characteristics. In addition, all frequency modes of a THz comb can be phase-locked to a microwave frequency standard, providing excellent traceability. However, the need for stabilization of dual femtosecond lasers has often hindered its wide use. To overcome this limitation, here we have demonstrated adaptive-sampling THz-DCS, allowing the use of free-running femtosecond lasers. To correct the fluctuation of the time and frequency scales caused by the laser timing jitter, an adaptive sampling clock is generated by dual THz-comb-referenced spectrum analysers and is used for a timing clock signal in a data acquisition board. The results not only indicated the successful implementation of THz-DCS with free-running lasers but also showed that this configuration outperforms standard THz-DCS with stabilized lasers due to the slight jitter remained in the stabilized lasers.

    Wednesday, August 20, 2014

    Abstract-Double-modulation reflection-type terahertz ellipsometer for measuring the thickness of a thin paint coating


    Tetsuo Iwata, Hiroaki Uemura, Yasuhiro Mizutani, and Takeshi Yasui  »View Author Affiliations
    http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-22-17-20595
    Optics Express, Vol. 22, Issue 17, pp. 20595-20606 (2014)
    http://dx.doi.org/10.1364/OE.22.020595

    We constructed a double-modulation, reflection-type terahertz (THz) ellipsometer for precise measurement of the thickness of a paint film which is coated on a metal surface and which is not transparent to visible or mid-infrared light. The double-modulation technique enabled us to directly obtain two ellipsometric parameters, Δ(ω) and Ψ(ω), as a function of angular frequency, ω, with a single measurement while reducing flicker noise due to a pump laser. The bias voltage of a photoconductive antenna (PCA) used as a THz pulse emitter was modulated at 100 kHz, and a first lock-in amplifier (LA1) was connected to the output of an electro-optic (EO) signal-sampling unit. In addition, a wire-grid polarizer (WGP) was rotated at 100 Hz to conduct polarization modulation with a frequency of 200 Hz. The output signal from LA1 was fed into a second lock-in amplifier (LA2) that worked in synchronization with the rotating WGP (RWGP). By operating LA2 in a quadrature phase-detection mode, we were able to obtain in-phase and out-of-phase signals simultaneously, from which the two ellipsometric parameters for an isotropic sample could be derived at the same time while cancelling common-mode noise. The lower detection limit of the thickness measurement and the relative standard deviation (RSD) of a black paint film coated on an aluminum substrate were 4.3 µm and 1.4%, respectively. The possibility of determining all elements of the Jones matrix for an anisotropic material is also discussed.
    © 2014 Optical Society of America