Showing posts with label Rayko Stantchev. Show all posts
Showing posts with label Rayko Stantchev. Show all posts

Friday, August 18, 2017

New Terahertz Imaging Approach Could Speed Up Skin Cancer Detection


To enable high resolution terahertz imaging, the researchers used a digital micromirrordevice to project laser light onto a silicon wafer in a specific pattern. When a terahertz beam passes through the wafer, a computer can reconstruct an image of the object based on the pattern of terahertz light detected. The inset shows an optical image of the test target (gold pinwheel) on a 6-mm thick silicon wafer. Credit: Rayko Stantchev, University of Exeter

Researchers show that subwavelength terahertz imaging works with methods that accelerate imaging speed

http://www.businesswire.com/news/home/20170817005602/en/New-Terahertz-Imaging-Approach-Speed-Skin-Cancer

WASHINGTON--()--Researchers have developed a new terahertz imaging approach that, for the first time, can acquire micron-scale resolution images while retaining computational approaches designed to speed up image acquisition. This combination could allow terahertz imaging to be useful for detecting early-stage skin cancer without requiring a tissue biopsy from the patient.

Terahertz wavelengths fall between microwaves and infrared light on the electromagnetic spectrum. Light in this region is ideal for biological applications because, unlike x-rays, it doesn’t carry enough energy to harm tissue. Other research has shown that skin cancer cells absorb terahertz light more strongly than healthy cells, demonstrating that terahertz imaging can be useful for distinguishing between cancerous and healthy tissue.
“Skin cancer can already be detected using terahertz light, but because of the low resolution of current imaging approaches, the cancer can only be seen after it has grown quite large,” said the research team’s leader, Rayko Stantchev of the University of Exeter, UK. “Ideally, we want to detect the cancer early, when it is still small. We hope that high-resolution terahertz images, combined with the ability to take an image quickly, could eventually lead to a device that could detect cancer in the doctor’s office.”
In Optica, The Optical Society's journal for high impact research, the researchers showed that their near-field approach to terahertz imaging can achieve a spatial resolution of about nine microns and was compatible with compressed sensing and adaptive imaging algorithms that allow three times faster image acquisition than conventional technologies.
In addition to its practical benefits for medical imaging, the research also represents a new way of accomplishing high resolution terahertz imaging. In conventional imaging, spatial resolution is limited by the diffraction limit, which is determined by the wavelength of light used. Although most imaging techniques detect scattered light at some distance from the object being imaged, the researchers overcame the diffraction limit by using a unique setup to measure close, or near-field, interactions of terahertz waves with the object being imaged. Their approach produced a resolution about 1/45 of the wavelength used for imaging.
“This is the first experimental demonstration, for any spectral region, showing that compressed sensing and adaptive imaging can be performed at resolutions much smaller than the wavelength of light used for imaging,” said Stantchev. “Showing that this is physically possible will allow engineers and scientists to start to think about the full potential of this approach.”
Subwavelength terahertz imaging
The primary innovation that made the new approach possible was a digital micromirror device (DMD), an array of tiny mirrors that can each be controlled by a computer. The researchers use the DMD to project a pattern of 800nm light onto a silicon wafer, which makes the wafer opaque to terahertz light in areas where the 800nm light hits the silicon. This means that when a terahertz beam passes though the wafer, it creates a patterned terahertz beam on the other side of the wafer that can then interact with an object being imaged. Because the pattern created by the DMD is known, a computer can reconstruct an image of the object based on the detected terahertz light.
Because near-field terahertz imaging approaches are typically plagued by slow acquisition speeds, the researchers designed their approach to be compatible with compressed sensing and adaptive sampling algorithms that increase the rate of imaging. These algorithms work similarly to image compression, which reduces the size of an image by getting rid of any data not needed to visually perceive an image. Compressed sensing and adaptive imaging algorithms take this a step farther by ignoring the unnecessary data to begin with, speeding up imaging by measuring only the vital components of the image.
“We used these algorithms to determine which regions of the wafer are transparent and which regions are not transparent, essentially creating pixels,” said Stantchev. “Because we were using a single-pixel terahertz detector, normally each pixel would acquire one measurement. However, by creating many transparent pixels in one measurement, an image can be acquired more quickly by taking fewer measurements than the number of pixels.”
The researchers used their setup to image a variety of objects and showed that the method could distinguish arms of a metallic cartwheel that were spaced about nine microns apart.
Moving towards practicality
“For our current setup, we have to use a very intense laser to make the silicon wafers opaque,” said Stantchev. “This laser is very big and expensive, so to make this approach practical we needed to figure out how to do it using a much cheaper and smaller laser.”
Stantchev is now working with researchers in the Chinese University of Hong Kong who have created a different optical setup that might be able to make the silicon wafers opaque using a less powerful laser. The researchers are now working together to see if this approach might make it possible to acquire subwavelength terahertz images using a laser that cost around $200 instead of the almost $400,000 laser used for the work reported in the Optica paper.
“This is one step toward making the technique more compatible with biological applications,” said Stantchev. “Eventually, we envision a device that could be used in the doctor’s office that would quickly reveal if skin cancer is present.”
Paper: R. I. Stantchev, D. B. Phillips, P. Hobson, S. M. Hornett, M. J. Padgett, E. Hendry, “Compressed sensing with near-field THz radiation,” Optica, Volume 4 Issue 8, 989-992 (2017).
About Optica
Optica is an open-access, online-only journal dedicated to the rapid dissemination of high-impact peer-reviewed research across the entire spectrum of optics and photonics. Published monthly by The Optical Society (OSA), Optica provides a forum for pioneering research to be swiftly accessed by the international community, whether that research is theoretical or experimental, fundamental or applied. Optica maintains a distinguished editorial board of more than 40 associate editors from around the world and is overseen by Editor-in-Chief Alex Gaeta, Columbia University, USA. For more information, visit Optica.

Tuesday, January 17, 2017

Advances in terahertz imaging



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A terahertz image taken with the newly developed terahertz imaging set-up. The image size is 2 mm × 2 mm and the structure was hidden behind a silicon wafer. Stantchev et al.

http://www.frontline.in/science-and-technology/advances-in-terahertz-imaging/article8745879.ece

TERAHERTZ imaging, which exists between the microwave and infrared wavelengths, has recently attracted attention for its ability to “see through” everyday objects. Among other things, it has been used to detect defects in space shuttle panels and uncover the material composition and substructure of paintings and murals. Current terahertz devices remain inherently slow, invasive, and better suited to non-biological materials. Besides, they are extremely expensive to manufacture. The British scientist Rayko Stantchev and associates have devised a new type of apparatus that could spur the development of cheaper, easier-to-manufacture terahertz imaging systems. Their technology relies on spatially controlling terahertz radiation in order to selectively illuminate parts of an object. The apparatus then measures the terahertz wavelengths transmitted through the selected parts of the object. The work was published in a recent issue of the journal Science Advances.
The scientists demonstrated the capability of the new technique using a circuit board hidden on the underside of a silicon wafer, showing that it was possible to see very tiny fissures in the circuit board. While they acknowledged the system used in this experiment would be difficult and expensive to manufacture commercially, the principles investigated here (photomodulation, near-field imaging and single pixel detection) have potential use in broader applications, including for other terahertz imaging systems.

Saturday, May 14, 2016

Abstract-Detection of defects on the surface of a semiconductor by terahertz surface plasmon polaritons


Tao Yang, Yuanyi Li, Rayko Stantchev, Yongyuan Zhu, Yiqiang Qin, Xinhui Zhou, and Wei Huang
https://www.osapublishing.org/ao/abstract.cfm?uri=ao-55-15-4139

We propose a new method for detecting small defects on the surface of a semiconductor by analyzing the transmission spectrum of terahertz surface plasmon polaritons. The field distributions caused by the detection of defects of different sizes are simulated. Experimentally, using a terahertz time domain spectrometer, we measure the transmission spectrum of terahertz surface plasmon polaritons passing through particles on the surface of an intrinsic InSb wafer. Our results show that the measured temporal waveform and frequency spectra are distinctly changed due to the presence of the particles, thereby confirming the effectiveness of this method for detecting defects. For increased detection efficiency, the frequency of the surface plasmon polaritons has to be slightly lower than the plasma frequency of the semiconductor. In comparison with traditional methods, our approach offers the merits of detecting both on-surface and subsurface defects, which is critical in monitoring the quality of semiconductor wafers.
© 2016 Optical Society of America
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