Abstract-Antireflection self-reference method based on ultrathin metallic nanofilms for improving terahertz reflection spectroscopy

Weien Lai, Haibing Cao, Jun Yang, Guangsheng Deng, Zhiping Yin, Qian Zhang, Beatriz Pelaz, and Pablo del Pino

https://www.osapublishing.org/oe/abstract.cfm?uri=oe-26-15-19470

We present the potential of an antireflection self-reference method based on ultra-thin tantalum nitride (TaN) nanofilms for improving terahertz (THz) reflection spectroscopy. The antireflection self-reference method is proposed to eliminate mutual interference caused by unwanted reflections, which significantly interferes with the important reflection from the actual sample in THz reflection measurement. The antireflection self-reference model was investigated using a wave-impedance matching approach, and the theoretical model was verified in experimental studies. We experimentally demonstrated this antireflection self-reference method can completely eliminate the effect of mutual interference, accurately recover the actual sample’s reflection and improve THz reflection spectroscopy. Our method paves the way to implement a straightforward, accurate and efficient approach to investigate THz properties of the liquids and biological samples.

© 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

Abstract-Quality-control of UV offset lithographicaly printed electronic-ink by THz technology

Yang Zeng, Robert Donnan, Marc Edwards, Bin Yang,

http://ieeexplore.ieee.org/document/8068504/

In this paper, a novel quality-monitor method of inkjet-printed electronics based on terahertz (THz) sensing is presented. Specifically, two different approaches, namely THz reflection spectroscopy and THz near-field scanning, are proposed.