Patrick R. Whelan, Deping Huang, David Mackenzie, Sara A. Messina, Zhancheng Li, Xin Li, Yunqing Li, Timothy J. Booth, Peter U. Jepsen, Haofei Shi, Peter Bøggild,
https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-26-14-17748
Fast inline characterization of the electrical properties of graphene on polymeric substrates is an essential requirement for quality control in industrial graphene production. Here we show that it is possible to measure the sheet conductivity of graphene on polymer films by terahertz time-domain spectroscopy (THz-TDS) when all internally reflected echoes in the substrate are taken into consideration. The conductivity measured by THz-TDS is comparable to values obtained from four point probe measurements. THz-TDS maps of 25x30 cm2 area graphene films were recorded and the DC conductivity and carrier scattering time were extracted from the measurements. Additionally, the THz-TDS conductivity maps highlight tears and holes in the graphene film, which are not easily visible by optical inspection.
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