Showing posts with label Jie Hu. Show all posts
Showing posts with label Jie Hu. Show all posts

Saturday, June 24, 2017

Abstract-Simultaneous measurement of refractive index and temperature based on all-dielectric metasurface



Jie Hu, Tingting Lang, and Guo-hua Shi

https://www.osapublishing.org/oe/abstract.cfm?uri=oe-25-13-15241

In this paper, a novel kind of sensors for simultaneous measurement of refractive index and temperature based on all-dielectric metasurfaces is proposed. The metasurfaces are constructed by an array of silicon nanoblocks on top of the bulk fused silica substrate. We used three-dimensional full wave electromagnetic field simulation by finite integral method to accurately calculate the transmission spectrum of the metasurfaces. Two transmission dips corresponding to the electric and magnetic resonances are observed. Both dips shift as the ambient refractive index or the temperature changes. Simulation results show that the sensing sensitivities of two dips to the refractive index are 243.44 nm/RIU and 159.43 nm/RIU, respectively, while the sensitivities to the temperature are 50.47 pm/°C and 75.20 pm/°C, respectively. After introducing four holes into each silicon nanoblock, the electromagnetic field overlap in the surrounding medium can be further promoted, and the sensitivities to the refractive index increase to 306.71 nm/RIU and 204.27 nm/RIU, respectively. Our proposed sensors have advantages of polarization insensitive, small size, and low loss, which offer them high potential applications in physical, biological and chemical sensing fields.
© 2017 Optical Society of America

Tuesday, January 24, 2017

Abstract-THz Vector Field Measurement Comparison Between On-the-Fly and Step Scan Method


Jie Hu, Zheng Lou, Qi-Jun Yao,  Wei Miao, Jin-Ping Yang,  Zhen-Hui Lin,  Sheng-Cai Shi,

http://ieeexplore.ieee.org/document/7797489/

A fast terahertz vector field measurement system based on the on-the-fly (OTF) scan method is investigated. Compared with the step scan method, which samples at certain step, the OTF scan obtains the data with the scanner moving continuously, thus improving the measurement efficiency to some extent. The phase stability of the system is fully studied. Demonstration at approximately 500 GHz is compared with the result by the step scan method, showing that the OTF method can improve the measurement speed by a factor of 7 while the data accuracy is almost the same. Measurements at different scanning speeds and with different probes are also compared to understand their effects.