Showing posts with label Jeonghoi Kim. Show all posts
Showing posts with label Jeonghoi Kim. Show all posts

Friday, November 22, 2019

Abstract-Computed terahertz near-field mapping of molecular resonances of lactose stereo-isomer impurities with sub-attomole sensitivity


Kiwon Moon, Youngwoong Do, Hongkyu Park, Jeonghoi Kim, Hyuna Kang, Gyuseok Lee, Jin-Ha Lim, Jin-Woo Kim,  Haewook Han


https://www.nature.com/articles/s41598-019-53366-0

Terahertz near-field microscopy (THz-NFM) could locally probe low-energy molecular vibration dynamics below diffraction limits, showing promise to decipher intermolecular interactions of biomolecules and quantum matters with unique THz vibrational fingerprints. However, its realization has been impeded by low spatial and spectral resolutions and lack of theoretical models to quantitatively analyze near-field imaging. Here, we show that THz scattering-type scanning near-field optical microscopy (THz s-SNOM) with a theoretical model can quantitatively measure and image such low-energy molecular interactions, permitting computed spectroscopic near-field mapping of THz molecular resonance spectra. Using crystalline-lactose stereo-isomer (anomer) mixtures (i.e., α-lactose (≥95%, w/w) and β-lactose (≤4%, w/w)), THz s-SNOM resolved local intermolecular vibrations of both anomers with enhanced spatial and spectral resolutions, yielding strong resonances to decipher conformational fingerprint of the trace β-anomer impurity. Its estimated sensitivity was ~0.147 attomoles in ~8 × 10−4 μm3 interaction volume. Our THz s-SNOM platform offers a new path for ultrasensitive molecular fingerprinting of complex mixtures of biomolecules or organic crystals with markedly enhanced spatio-spectral resolutions. This could open up significant possibilities of THz technology in many fields, including biology, chemistry and condensed matter physics as well as semiconductor industries where accurate quantitative mappings of trace isomer impurities are critical but still challenging.

Thursday, December 4, 2014

Abstract-Subsurface Nanoimaging by Broadband Terahertz Pulse Near-Field Microscopy


Department of Electrical and Computer Engineering,POSTECH, San 31, Hyoja-dong, Nam-gu, Pohang, Kyungbuk 790-784, Korea
Nano Lett., Article ASAP
DOI: 10.1021/nl503998v
Publication Date (Web): December 1, 2014
Copyright © 2014 American Chemical Society
*E-mail: hhan@postech.ac.kr.

Combined with terahertz (THz) time-domain spectroscopy, THz near-field microscopy based on an atomic force microscope is a technique that, while challenging to implement, is invaluable for probing low-energy light-matter interactions of solid-state and biomolecular nanostructures, which are usually embedded in background media. Here, we experimentally demonstrate a broadband THz pulse near-field microscope that provides subsurface nanoimaging of a metallic grating embedded in a dielectric film. The THz near-field microscope can obtain broadband nanoimaging of the subsurface grating with a nearly frequency-independent lateral resolution of 90 nm, corresponding to ∼λ/3300, at 1 THz, while the AFM only provides a flat surface topography.

Monday, December 1, 2014

Abstract-Sub-surface nanoimaging by broadband terahertz pulse near-field microscopy


Nano Lett., Just Accepted Manuscript
DOI: 10.1021/nl503998v
Publication Date (Web): December 1, 2014
Copyright © 2014 American Chemical Society
http://pubs.acs.org/doi/abs/10.1021/nl503998v?journalCode=nalefd

Combined with THz time-domain spectroscopy, THz near-field microscopy based on an atomic force microscope is a technique that, while challenging to implement, is invaluable for probing low-energy light-matter interactions of solid-state and biomolecular nanostructures, which are usually embedded in background media. Here, we experimentally demonstrate a broadband THz pulse near-field microscope that provides sub-surface nanoimaging of a metallic grating embedded in a dielectric film. The THz near-field microscope can obtain broadband nanoimaging of the sub-surface grating with a nearly frequency-independent lateral resolution of 90 nm, corresponding to ~λ/3300, at 1 THz, while the AFM only provides a flat surface topography.