Abstract-Impact ionization induced by terahertz radiation in HgTe quantum wells of critical thickness

S. Hubmann, G.V. Budkin, M. Urban, V.V. Bel'kov, A.P.Dmitriev, J. Ziegler, D.A. Kozlov, N.N. Mikhailov, S.A. Dvoretsky, Z.D. Kvon, D. Weiss, S.D. Ganichev

https://arxiv.org/abs/2001.10263

We report on the observation of terahertz (THz) radiation induced band-to-band impact ionization in \HgTe quantum well (QW) structures of critical thickness, which are characterized by a nearly linear energy dispersion. The THz electric field drives the carriers initializing electron-hole pair generation. The carrier multiplication is observed for photon energies less than the energy gap under the condition that the product of the radiation angular frequency ω and momentum relaxation time τl larger than unity. In this case, the charge carriers acquire high energies solely because of collisions in the presence of a high-frequency electric field. The developed microscopic theory shows that the probability of the light impact ionization is proportional to exp(−E20/E2), with the radiation electric field amplitude E and the characteristic field parameter E0. As observed in experiment, it exhibits a strong frequency dependence for ωτ≫1 characterized by the characteristic field E0 linearly increasing with the radiation frequency ω

Abstract-Photogalvanic probing of helical edge channels in two-dimensional HgTe topological insulators

K.-M. Dantscher, D. A. Kozlov, M. T. Scherr, S. Gebert, J. Bärenfänger, M. V. Durnev, S. A. Tarasenko, V. V. Bel'kov, N. N. Mikhailov, S. A. Dvoretsky, Z. D. Kvon, J. Ziegler, D. Weiss, and S. D. Ganichev

https://journals.aps.org/prb/abstract/10.1103/PhysRevB.95.201103

We report on the observation of a circular photogalvanic current excited by terahertz laser radiation in helical edge channels of two-dimensional (2D) HgTe topological insulators (TIs). The direction of the photocurrent reverses by switching the radiation polarization from a right-handed to a left-handed one and, for fixed photon helicity, is opposite for the opposite edges. The photocurrent is detected in a wide range of gate voltages. With decreasing the Fermi level below the conduction band bottom, the current emerges, reaches a maximum, decreases, changes its sign close to the charge neutrality point (CNP), and again rises. Conductance measured over a $\approx 3\mu m$ distance at CNP approaches $2e^2/h$, the value characteristic for ballistic transport in 2D TIs. The data reveal that the photocurrent is caused by photoionization of helical edge electrons to the conduction band. We discuss the microscopic model of this phenomenon and compare calculations with experimental data.

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